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Inventor

Yutaka Terada

Inventor
Osaka, JP

Overview

40→
Patents
1992–2019
Patent span
Physics
Primary field (CPC G)

Patents· 40 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G11Cprimary
G11CStatic stores21%
G01RMeasuring electric variables10%
H03KPulse technique10%
G06FElectric digital data processing6%
H04LTransmission of digital information, e.g. telegraphic communication6%
B23HWorking of metal by the action of a high concentration of electric current on a workpiece using an electrode which takes the place of a tool5%
G04FTime-interval measuring5%
H03DDemodulation or transference of modulation from one carrier to another5%
H10BElectronic memory devices5%
H01LSemiconductor devices3%
PatentTitleYear
10,345,515Bonded structure, method for manufacturing the same, and bonding state detection method20199,240,221'Semiconductor memory device with a selection transistor having same shape and size as a memory cell transistor'20168,811,078'Semiconductor memory device'20148,072,832'Electronic equipment system and semiconductor integrated circuit controller'20117,692,955'Semiconductor integrated circuit'20107,254,088'Semiconductor memory'20077,187,573'Memory circuit and method of generating the same'20077,149,267'Input circuit and output circuit'20066,831,356'Memory macro and semiconductor integrated circuit'20046,829,316'Input circuit and output circuit'20046,787,727'Automatic wire electrode feeder for wire electric discharge machining devices'20046,711,086'Multiport semiconductor memory with different current-carrying capability between read ports and write ports'20046,698,639'Automatic wire supply system of wire cut electrodischarge machine'20046,633,588'Data transferring device'20036,604,201'Network unit with power saving mode inhibit based on interconnection relationship to neighboring nodes which is stored on the unit'20036,542,552'Data transmitter'20036,498,519'Voltage control circuit network device and method of detecting voltage'20026,417,700'Voltage level detection circuit and voltage level detection method'20026,404,370'Semiconductor integrated circuit realizing electrical interface'20026,356,144'LSI core including voltage generation circuit and system LSI including the LSI core'20026,339,355'Offsetting comparator device and comparator circuit'20026,329,843'Output driver with current compensation circuit for variation of common mode voltage'20016,297,675'Semiconductor integrated circuit and semiconductor integrated circuit system having serially interconnectable data buses'20016,262,568'Common mode bias generator'20016,255,863'Circuit and method for determining level of differential signal'20016,246,627'Semiconductor device capable of cutting off a leakage current in a defective array section and method thereof'20016,208,567'Semiconductor device capable of cutting off a leakage current in a defective array section'20016,172,557'Time counting circuit, pulse converting circuit and FM demodulating circuit'20016,163,459'Semiconductor mounting system and semiconductor chip'20006,145,065'Memory access buffer and reordering apparatus using priorities'20006,121,815'Semiconductor integrated circuit, system, and method for reducing a skew between a clock signal and a data signal'20006,009,024'Semiconductor memory'19995,999,586'Time counting circuit and pulse signal generating method'19995,982,841'Time counting circuit, pulse converting circuit and FM demodulating circuit'19995,933,384'Semiconductor integrated circuit'19995,835,552'Time counting circuit and counter circuit'19985,828,717'Time counting circuit and counter circuit'19985,717,624'Analog memory circuit and method for recording analog signal'19985,216,217'Wirecut electrical discharge machine'19935,166,490'Wire cut electric discharge machining apparatus'1992

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1992–2004Patents assigned to MITSUBISHI ELECTRIC CORP (4)· patent assignee history
1992–1993Based in Aichi, JP· patent location history
1998–2007Patents assigned to MATSUSHITA ELECTRIC INDUSTRIAL CO LTD (31)· patent assignee history
1998–2016Based in Osaka, JP· patent location history
2000–2007Based in Hirakata, JP· patent location history
2004–2019Based in Tokyo, JP· patent location history
2010–2016Patents assigned to PANASONIC CORP (4)· patent assignee history
2011–2014Patents assigned to TERADA YUTAKA (2)· patent assignee history
2011Patents assigned to AGATA YASUHIRO (1)· patent assignee history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD311998–2007
MITSUBISHI ELECTRIC CORP41992–2004
PANASONIC CORP42010–2016
TERADA YUTAKAself22011–2014
AGATA YASUHIRO12011
Locations
LocationPatentsSpan
Osaka, JP291998–2016
Hirakata, JP62000–2007
Tokyo, JP32004–2019
Aichi, JP21992–1993