Inventor
Yue Li
Inventor
Hopewell Junction, NY, US
Overview
Patents· 22 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G05Bprimary
G05BControl or regulating systems in general19%
Y02PClimate change mitigation technologies in the production or processing of goods19%
G06FElectric digital data processing12%
A61BDiagnosis5%
A61NElectrotherapy5%
G06QInformation and communication technology [ict] specially adapted for administrative, commercial, financial, managerial or supervisory purposes5%
G16ZInformation and communication technology [ict] specially adapted for specific application fields, not otherwise provided for5%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h105%
B01DSeparation2%
F25BRefrigeration machines, plants or systems2%
PatentTitleYear
10,872,298Machine learning and prediction using graph communities202010,507,428Heat-pipe membrane module with heat recovery201910,496,721Online activity index201910,489,367Generating an index for a table in a database background201910,296,624Document curation201910,296,623Document curation2019D0819403Drinking bottle20189,669,221'System to detect lead location from medical image'20179,628,430'Notifications based on social network service activity and profile triggers'20179,333,361'System and method to automatically incorporate lead information from medical image into programmable user interface'2016D0695616'Bottle'20138,565,910'Manufacturing execution system (MES) including a wafer sampling engine (WSE) for a semiconductor manufacturing process'20138,229,691'Method for using real-time APC information for an enhanced lot sampling engine'20127,899,566'Factory level and tool level advanced process control systems integration implementation'20117,895,008'Method of performing measurement sampling of lots in a manufacturing process'2011D0602721'Condom holder'20097,577,537'Providing a dynamic sampling plan for integrated metrology'20097,509,186'Method and system for reducing the variation in film thickness on a plurality of semiconductor wafers having multiple deposition paths in a semiconductor manufacturing process'20097,489,980'Factory level and tool level advanced process control systems integration implementation'20097,398,172'Method and system of providing a dynamic sampling plan for integrated metrology'20087,113,845'Integration of factory level and tool level advanced process control systems'20066,717,814'Heat dissipation assembly'2004Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2006–2019Patents assigned to IBM (12)· patent assignee history
2006–2013Based in Hopewell Junction, NY, US· patent location history
2009–2018Patents assigned to FI DESIGN INC (3)· patent assignee history
2009–2013Based in Chino, CA, US· patent location history
2012–2013Patents assigned to BEHM GARY W (2)· patent assignee history
2012–2013Patents assigned to LI YUE (2)· patent assignee history
2012Patents assigned to BEN SALEM MALEK (1)· patent assignee history
2016–2017Based in Sherman Oaks, CA, US· patent location history
2019Based in Beijing, CN· patent location history
2020Based in San Mateo, CA, US· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| IBM | 12 | 2006–2019 |
| FI DESIGN INC | 3 | 2009–2018 |
| BEHM GARY W | 2 | 2012–2013 |
| LI YUEself | 2 | 2012–2013 |
| BEN SALEM MALEK | 1 | 2012 |
Locations
| Location | Patents | Span |
|---|---|---|
| Hopewell Junction, New York, US | 9 | 2006–2013 |
| Beijing, CN | 4 | 2019 |
| Sherman Oaks, California, US | 2 | 2016–2017 |
| Chino, California, US | 2 | 2009–2013 |
| San Mateo, California, US | 1 | 2020 |