Inventor
TOSHIFUMI HONDA
Inventor
JP
Overview
Patents· 16 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties52%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1013%
H01LSemiconductor devices10%
G01BMeasuring length, thickness or similar linear dimensions6%
G02BOptical elements, systems or apparatus6%
G06TImage data processing or generation, in general6%
G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices3%
H04NPictorial communication, e.g. television3%
PatentTitleYear
12,422,377Defect inspection apparatus and defect inspection method202512,400,889Defect inspection device202512,366,538Defect inspection apparatus and defect inspection method202512,366,443Surface inspection device and shape measurement software202512,345,654Defect inspection device, defect inspection method, and adjustment substrate202512,345,661Defect inspection apparatus and defect inspection method202512,313,566Defect inspection device and defect inspection method202512,292,389Defect inspection apparatus202512,196,673Defect inspection apparatus and defect inspection method202512,146,840Defect inspection device202412,044,627Defect inspection device and defect inspection method202412,025,569Defect inspection device and inspection method, and optical module202411,442,024Defect classification device, inspection device, and inspection system202211,346,791Inspection device and inspection method thereof202211,143,598Defect inspection apparatus and defect inspection method202111,143,600Defect inspection device2021Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2021–2025Patents assigned to HITACHI HIGH TECH CORP (16)· patent assignee history
2021–2025Based in JP· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| HITACHI HIGH TECH CORP | 16 | 2021–2025 |
Locations
| Location | Patents | Span |
|---|---|---|
| JP | 16 | 2021–2025 |