Inventor
Andrew Weeks Kueny
Inventor
Dallas, TX, US
Overview
Patents· 13 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties25%
G01JMeasurement of intensity, velocity, spectral content, polarisation, phase or pulse characteristics of infrared, visible or ultraviolet light16%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1016%
G01BMeasuring length, thickness or similar linear dimensions9%
G06KGraphical data reading6%
H01JElectric discharge tubes or discharge lamps6%
H01LSemiconductor devices6%
B24BMachines, devices, or processes for grinding or polishing3%
G05BControl or regulating systems in general3%
H04NPictorial communication, e.g. television3%
PatentTitleYear
10,861,755System and method for measurement of complex structures202010,365,212System and method for calibration of optical signals in semiconductor process systems20199,997,325Electron beam exciter for use in chemical analysis in processing systems20189,772,226'Referenced and stabilized optical measurement system'20179,386,241'Apparatus and method for enhancing dynamic range of charge coupled device-based spectrograph'20169,383,323'Workpiece characterization system'20168,125,633'Calibration of a radiometric optical monitoring system used for fault detection and process monitoring'20127,339,682'Heterodyne reflectometer for film thickness monitoring and method for implementing'20087,049,156'System and method for in-situ monitor and control of film thickness and trench depth'20066,991,514'Optical closed-loop control system for a CMP apparatus and method of manufacture thereof'20066,642,063'Apparatus for characterization of microelectronic feature quality'20036,432,729'Method for characterization of microelectronic feature quality'20026,052,188'Spectroscopic ellipsometer'2000Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2000–2020Patents assigned to VERITY INSTR INC (12)· patent assignee history
2000–2018Based in Dallas, TX, US· patent location history
2012–2018Patents assigned to KUENY ANDREW WEEKS (5)· patent assignee history
2012–2017Patents assigned to CORLESS JOHN DOUGLAS (3)· patent assignee history
2012–2018Patents assigned to WHELAN MIKE (3)· patent assignee history
2012–2018Patents assigned to HARVEY KENNETH C (2)· patent assignee history
2019–2020Based in Carrollton, TX, US· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| VERITY INSTR INC | 12 | 2000–2020 |
| KUENY ANDREW WEEKSself | 5 | 2012–2018 |
| CORLESS JOHN DOUGLAS | 3 | 2012–2017 |
| WHELAN MIKE | 3 | 2012–2018 |
| HARVEY KENNETH C | 2 | 2012–2018 |
Locations
| Location | Patents | Span |
|---|---|---|
| Dallas, Texas, US | 11 | 2000–2018 |
| Carrollton, Texas, US | 2 | 2019–2020 |