LexDanaLexDanabeta
Inventor

Joerg Kiesewetter

Inventor
Sacka, DE

Overview

7→
Patents
2007–2016
Patent span
Physics
Primary field (CPC G)

Patents· 7 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Rprimary
G01RMeasuring electric variables86%
G02BOptical elements, systems or apparatus14%
PatentTitleYear
9,395,411'Method for testing a test substrate under defined thermal conditions and thermally conditionable prober'20168,497,693'Method for testing a test substrate under defined thermal conditions and thermally conditionable prober'20138,402,848'Probe holder'20138,072,586'Arrangement and method for focusing a multiplane image acquisition on a prober'20117,282,930'Device for testing thin elements'20077,265,536'Procedure for reproduction of a calibration position of an aligned and afterwards displaced calibration substrate in a probe station'20077,235,990'Probe station comprising a bellows with EMI shielding capabilities'2007

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

2007Patents assigned to SUSS MICROTEC TEST SYS GMBH (3)· patent assignee history
2007–2016Based in Sacka, DE· patent location history
2011–2016Patents assigned to CASCADE MICROTECH INC (4)· patent assignee history
2011–2013Patents assigned to KIESEWETTER JOERG (3)· patent assignee history
2011–2013Patents assigned to TEICH MICHAEL (2)· patent assignee history
2013Patents assigned to KANEV STOJAN (2)· patent assignee history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
CASCADE MICROTECH INC42011–2016
KIESEWETTER JOERGself32011–2013
SUSS MICROTEC TEST SYS GMBH32007
KANEV STOJAN22013
TEICH MICHAEL22011–2013
Locations
LocationPatentsSpan
Sacka, DE72007–2016