Inventor

Kristina H. V. Hedengren

Inventor

Schenectady, NY, US

Overview

1989–2005

Patent span

Physics

Primary field (CPC G)

Patents· 35 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Nprimary

G01NInvestigating or analysing materials by determining their chemical or physical properties36%

A61BDiagnosis13%

G01KMeasuring temperature5%

G06TImage data processing or generation, in general5%

H10NElectric solid-state devices not otherwise provided for5%

Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests5%

B82YSpecific uses or applications of nanostructures4%

G01BMeasuring length, thickness or similar linear dimensions4%

G01RMeasuring electric variables4%

G01TMeasurement of nuclear or x-radiation4%

PatentTitleYear

6,916,290'In situ tumor temperature profile measuring probe and method'2005 6,701,615'Inspection and sorting system and method for part repair'2004 6,697,764'Reduced access field inspection system and apparatus'2004 6,550,681'Internet related appliances'2003 6,419,635'In situ tumor temperature profile measuring probe and method'2002 6,252,393'System and method for normalizing and calibrating a sensor array'2001 6,180,867'Thermal sensor array and methods of fabrication and use'2001 6,084,174'Method for detecting temperature gradients in biological tissue using a thermocouple array'2000 6,029,530'Finger controlled inspection apparatus'2000 5,909,004'Thermocouple array and method of fabrication'1999 5,903,147'Eddy current array inspection device for shaped holes'1999 5,895,871'Finger controlled inspection apparatus'1999 5,841,277'Hand-holdable probe having a flexible eddy current sensor'1998 5,822,392'Multi-resolution detection for increasing in an x-ray imaging implementation of an object'1998 5,801,532'Hand-holdable eddy-current probe'1998 5,717,332'System and method using eddy currents to acquire positional data relating to fibers in a composite'1998 5,659,248'Multilayer eddy current probe array for complete coverage of an inspection surface without mechanical scanning'1997 5,611,026'Combining a priori data with partial scan data to project three dimensional imaging of arbitrary objects with computerized tomography'1997 5,463,201'Seam-tracking apparatus for a welding system employing an array of eddy current elements'1995 5,420,429'Multilayer transducer array'1995 5,418,457'System and method for aligning an inspection probe and maintaining uniform spacing between the probe surface and an inspection surface'1995 5,389,876'Flexible eddy current surface measurement array for detecting near surface flaws in a conductive part'1995 5,371,461'Apparatus and method for compensating for variations in the lift-off of eddy current surface inspection array elements'1994 5,371,462'Eddy current inspection method employing a probe array with test and reference data acquisition and signal processing'1994 5,345,514'Method for inspecting components having complex geometric shapes'1994 5,319,693'Three dimensional computerized tomography scanning configuration for imaging large objects with smaller area detectors'1994 5,315,234'Eddy current device for inspecting a component having a flexible support with a plural sensor array'1994 5,278,884'Complete 3D CT data acquisition using practical scanning paths on the surface of a sphere'1994 5,262,722'Apparatus for near surface nondestructive eddy current scanning of a conductive part using a multi-layer eddy current probe array'1993 5,237,271'Apparatus and method for non-destructive testing using multi-frequency eddy currents'1993 5,182,513'Method and apparatus for a multi-channel multi-frequency data acquisition system for nondestructive eddy current inspection testing'1993 5,073,910'Square wave cone beam scanning trajectory for data completeness in three-dimensional computerized tomography'1991 5,006,800'Eddy current imaging apparatus and method using phase difference detection'1991 4,920,491'Enhancement of image quality by utilization of a priori information'1990 4,803,639'X-ray inspection system'1989

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1989–2005Patents assigned to GEN ELECTRIC (34)· patent assignee history

1989–2005Based in Schenectady, NY, US· patent location history

2002Patents assigned to GEN ELECTRIC COMPSANY (1)· patent assignee history

Inventor activity

Assignee and location history derived from the patent record.

Assignees

Assignee	Patents	Span
GEN ELECTRIC	34	1989–2005
GEN ELECTRIC COMPSANY	1	2002

Locations

Location	Patents	Span
Schenectady, New York, US	35	1989–2005