Inventor
Sipke Wadman
Inventor
Eindhoven, NL
Overview
Patents· 21 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties33%
A61BDiagnosis14%
G01BMeasuring length, thickness or similar linear dimensions14%
B23KSoldering or unsoldering7%
C03CChemical composition of glasses, glazes or vitreous enamels5%
H01JElectric discharge tubes or discharge lamps5%
B05DProcesses for applying fluent materials to surfaces, in general2%
B30BPresses in general2%
B32BLayered products, i.e. products built-up of strata of flat or non-flat, e.g. cellular or honeycomb, form2%
C04BLime, magnesia2%
PatentTitleYear
8,610,767'Apparatus for skin imaging, system for skin analysis'20138,462,356'Apparatus and method for observing the surface of a sample'20138,422,007'Optical measurement device with reduced contact area'20138,269,983'Apparatus for observing the surface of a sample'20128,077,319'Apparatus and a method for observing the surface of a sample'20117,978,332'Optical measurement device'20117,872,754'Optical measurement device'20117,649,628'Optical inspection of test surfaces'20107,554,665'Dual beam set-up for parousiameter'20097,349,096'Scatterometer and a method for observing a surface'20087,248,368'Scatterometer and a method for inspecting a surface'20076,617,541'Laser etching method'20036,577,397'Scatterometer'20036,451,387'Method of applying a ceramic layer to an under-layer having relatively low melting temperature'20026,025,037'Method of curing a film'20005,993,894'Method of manufacturing a conductive layer on a substrate'19995,460,451'Pyrometer including an emissivity meter'19955,406,042'Device for and method of providing marks on an object by means of electromagnetic radiation'19954,726,047'X-ray analysis apparatus'19884,684,251'Spectrometer'19873,981,666'Compression device'1976Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1976Based in Hoogezand, NL· patent location history
1987–2000Patents assigned to PHILIPS CORP (6)· patent assignee history
1987–2013Based in Eindhoven, NL· patent location history
2002–2013Patents assigned to KONINKL PHILIPS ELECTRONICS NV (12)· patent assignee history
2009–2013Based in Waalre, NL· patent location history
2011–2013Patents assigned to WADMAN SIPKE (5)· patent assignee history
2013Patents assigned to KONINKL PHILIPS NV (1)· patent assignee history
2013Patents assigned to KONINNKLIJKE PHILIPS ELECTRONICS N V (1)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| KONINKL PHILIPS ELECTRONICS NV | 12 | 2002–2013 |
| PHILIPS CORP | 6 | 1987–2000 |
| WADMAN SIPKEself | 5 | 2011–2013 |
| KONINKL PHILIPS NV | 1 | 2013 |
| KONINNKLIJKE PHILIPS ELECTRONICS N V | 1 | 2013 |
Locations
| Location | Patents | Span |
|---|---|---|
| Eindhoven, NL | 17 | 1987–2013 |
| Waalre, NL | 3 | 2009–2013 |
| Hoogezand, NL | 1 | 1976 |