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Inventor

Katsuhiro Kitahashi

Inventor
Hitachinaka, JP

Overview

3→
Patents
2005–2014
Patent span
Physics
Primary field (CPC G)

Patents· 3 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties33%
G06TImage data processing or generation, in general33%
H01JElectric discharge tubes or discharge lamps17%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1017%
PatentTitleYear
8,824,773'Defect observation method and defect observation device'20147,181,060'Defect inspection method'20076,968,079'Investigation device and investigation method'2005

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

2005–2007Patents assigned to HITACHI LTD (2)· patent assignee history
2005–2014Based in Hitachinaka, JP· patent location history
2014Patents assigned to HIRAI TAKEHIRO (1)· patent assignee history
2014Patents assigned to HITACHI HIGH TECH CORP (1)· patent assignee history
2014Patents assigned to KITAHASHI KATSUHIRO (1)· patent assignee history
2014Patents assigned to MINEKAWA YOHEI (1)· patent assignee history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
HITACHI LTD22005–2007
HIRAI TAKEHIRO12014
HITACHI HIGH TECH CORP12014
KITAHASHI KATSUHIROself12014
MINEKAWA YOHEI12014
Locations
LocationPatentsSpan
Hitachinaka, JP32005–2014