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Inventor

Shinji Yamada

Inventor
Kanagawa, JP

Overview

106→
Patents
1976–2018
Patent span
Electricity
Primary field (CPC H)

Patents· 106 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

H10Hprimary
H10HInorganic light-emitting semiconductor devices having potential barriers7%
Y10TTechnical subjects covered by former us classification6%
H01LSemiconductor devices6%
H05KPrinted circuits5%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h105%
H01RElectrically-conductive connections4%
G01RMeasuring electric variables3%
C08KUse of inorganic or non-macromolecular organic substances as compounding ingredients3%
F16HGearing3%
F02BInternal-combustion piston engines2%
PatentTitleYear
10,110,086Motor and female connector20189,960,538Connector Assembly20189,930,726'Heating device and heating method'20189,899,755'Connector and connection structure'20189,724,960'Automobile wheel disk'20179,553,395'Connector having a barrel and an end bell'20179,472,720'Nitride semiconductor wafer, nitride semiconductor element, and method for manufacturing nitride semiconductor wafer'20169,419,175'Semiconductor light emitting device'20169,373,753'Method for manufacturing semiconductor light emitting device'20169,362,651'Locking structure of terminal fitting and bulb socket'20169,362,115'Nitride semiconductor wafer, nitride semiconductor element, and method for manufacturing nitride semiconductor wafer'20169,337,385'Semiconductor light emitting element and method for manufacturing the same'20169,269,868'Semiconductor light emitting element and method for manufacturing semiconductor light emitting element'20169,246,257'Connector'20169,184,242'Nitride semiconductor wafer, nitride semiconductor element, and method for manufacturing nitride semiconductor wafer'20159,176,055'System and method for measuring narrow and wide angle light scatter on a high-speed cell sorting device'20159,160,094'Wire array rubber connector and method for producing the same'20159,130,127'Semiconductor light emitting device'20159,070,841'Semiconductor light emitting device and method for manufacturing same'20159,012,888'Semiconductor light emitting device, wafer, method for manufacturing semiconductor light emitting device, and method for manufacturing wafer'20158,991,573'Damper'20158,944,700'Connector'20158,937,325'Semiconductor device, wafer, method for manufacturing semiconductor device, and method for manufacturing wafer'20158,921,886'Semiconductor light emitting device, semiconductor light emitting apparatus, and method for manufacturing semiconductor light emitting device'20148,890,194'Semiconductor light emitting device'20148,876,641'Chain tensioner device'20148,820,989'Fixing structure of indoor lamp'20148,816,367'Semiconductor light emitting device and method for manufacturing same'20148,771,118'Chain tensioner device'20148,770,671'Automotive wheel'20148,729,583'Semiconductor light-emitting device'20148,708,392'Retractable vehicle seat'20148,685,872'Low softening point glass composition, bonding material using same and electronic parts'20148,672,718'Board connecting terminal and holding structure of circuit board'20148,569,738'Semiconductor light emitting device, wafer, method for manufacturing semiconductor light emitting device, and method for manufacturing wafer'20138,487,222'Heating electrode and method for heating material-to-be-heated by using the heating electrode'20138,470,723'Low softening point glass composition, bonding material using same and electronic parts'20138,466,435'Fine particle measuring device'20138,421,085'Semiconductor light-emitting device'20138,416,480'Hologram reproducing apparatus, hologram reproducing method, and phase modulating element'20138,384,045'Minute particle analyzing device and method'20138,367,573'Glass composition and its applications'20138,307,863'Fuel filling and waste solution recovery apparatus and fuel vessel'20128,137,225'Chain tensioner device'20127,896,531'Electrical assembly and method of transporting the same'20117,717,081'Engine cylinder head structure'20107,588,463'Connector and method of producing the same'20097,580,433'Laser system'20097,375,155'Low dielectric loss tangent resin composition, curable film and cured product, electrical part using the same and method for production thereof'20087,233,111'Illumination device'20077,224,228'Semiconductor integrated circuit for high frequency power amplifier, electronic component for high frequency power amplifier, and radio communication system'20077,193,471'High frequency power amplifier circuit and radio communication system'20077,193,009'Electronic device using low dielectric loss tangent insulators for high frequency signals'20077,167,378'Circuit board transmitting high frequency signal'20077,123,095'High frequency power amplifier circuit and radio communication system'20067,112,627'Low dielectric loss tangent films and wiring films'20067,034,617'Semiconductor integrated circuit for high frequency power amplifier, electronic component for high frequency power amplifier, and radio communication system'20066,930,140'Low dielectric loss tangent resin composition, curable film and cured product, electrical part using the same and method for production thereof'20056,900,627'Apparatus and method for testing semiconductor integrated circuit'20056,855,952'Semiconductor device and semiconductor package'20056,756,441'Low dielectric loss tangent resin composition, curable film and cured product, electrical part using the same and method for production thereof'20046,714,888'Apparatus for testing semiconductor integrated circuit'20046,690,189'Apparatus and method for testing semiconductor integrated circuit'20046,672,296'Cylinder head structure in multi-cylinder engine'20046,661,248'Tester for semiconductor integrated circuits'20036,653,855'External test auxiliary device to be used for testing semiconductor device'20036,651,023'Semiconductor test apparatus, and method of testing semiconductor device'20036,642,736'Tester for semiconductor integrated circuits and method for testing semiconductor integrated circuits'20036,638,631'Thermal stable low elastic modulus material and device using the same'20036,638,352'Thermal stable low elastic modulus material and device using the same'20036,634,004'Threshold analysis system capable of deciding all threshold voltages included in memory device through single processing'20036,628,137'Apparatus and method for testing semiconductor integrated circuit'20036,620,067'Tensioner device'20036,561,156'Cylinder head apparatus'20036,551,697'Printed circuit board, method of making same, and photomask for use in the method'20036,550,389'Printing method for printing on can barrel'20036,513,506'Cylinder head structure in multi-cylinder engine'20036,492,923'Test system and testing method using memory tester'20026,456,102'External test ancillary device to be used for testing semiconductor device, and method of testing semiconductor device using the device'20026,428,688'Oil path structure'20026,338,937'Lithography method and method for producing a wiring board'20026,304,633'Testing system for voice system equipment in switchboard'20016,237,678'Heat exchanger'20016,013,748'Aromatic ester compound and second-order non-linear optical material therewith'20006,002,166'Semiconductor device'19995,998,856'Semiconductor device'19995,913,742'Tensioner for an endless transmitting member'19995,856,384'Polycyclic aromatic compounds having nonlinear optical properties'19995,791,309'Balancer shaft supporting structure in engine'19985,741,577'Magnetic recording medium having a lubricant layer with a specified structure of a specified perfluoropolyether lubricant'19985,460,858'Method for forming a smooth-surfaced insulating layer'19955,327,583'Using a clock signal generated by a microcomputer for providing a negative bias voltage to a galium arsenide field effect transistor in a high frequency amplifier of the device'19945,249,854'Braking circuit provided with antilocking apparatus'19935,222,379'Circular knitting machine for knitting body suits and the like'19935,191,121'Aroyl ketone derivative, UV ray absorber comprising the same, and cosmetic composition containing the same'19935,146,002'Aroyl ketone derivative, UV ray absorber comprising the same, and cosmetic composition containing the same'19925,126,212'Multi-layered sintered sliding member'19925,004,301'Modulator for use in an anti-lock brake control system'19914,925,730'Liquid active substance slow releasing device'19904,612,561'Parallel-connected gate turn-off thyristors'19864,605,236'Cylinder head gasket construction'19864,509,203'Auto tuning receiver with a tuning information memory'19854,505,987'Sliding member'19854,377,345'Alarm signaling circuit for timepiece'19834,371,268'Time correcting circuit for timepiece with electrochromic display'19833,969,011'Attachment assembly for preventing improper positional mounting'1976

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1986–2012Patents assigned to HITACHI LTD (11)· patent assignee history
1986–2016Based in Tokyo, JP· patent location history
1998–2015Patents assigned to HONDA MOTOR CO LTD (10)· patent assignee history
1998–2015Based in Wako, JP· patent location history
2000–2014Based in Tsukuba, JP· patent location history
2002–2004Patents assigned to RYODEN SEMICONDUCTOR SYST ENG (10)· patent assignee history
2002–2005Based in Hyogo, JP· patent location history
2003–2018Based in Kanagawa, JP· patent location history
2012–2015Patents assigned to YAMADA SHINJI (25)· patent assignee history
2013–2016Patents assigned to TOSHIBA KK (17)· patent assignee history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
YAMADA SHINJIself252012–2015
TOSHIBA KK172013–2016
HITACHI LTD111986–2012
HONDA MOTOR CO LTD101998–2015
RYODEN SEMICONDUCTOR SYST ENG102002–2004
Locations
LocationPatentsSpan
Kanagawa, JP192003–2018
Tokyo, JP131986–2016
Tsukuba, JP132000–2014
Hyogo, JP112002–2005
Wako, JP91998–2015