Inventor
SCOTT ANDERSON MIDDLEBROOKS
Inventor
NL
Overview
Patents· 17 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G03Fprimary
G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices28%
G06TImage data processing or generation, in general17%
G06FElectric digital data processing14%
G06NComputing arrangements based on specific computational models14%
G06VImage or video recognition or understanding9%
G01NInvestigating or analysing materials by determining their chemical or physical properties5%
H01JElectric discharge tubes or discharge lamps5%
G01BMeasuring length, thickness or similar linear dimensions3%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h103%
G06KGraphical data reading2%
PatentTitleYear
12,586,170System and method for generating predictive images for wafer inspection using machine learning202612,567,164Apparatus and method for determining three dimensional data based on an image of a patterned substrate202612,493,247Method and system for predicting process information with a parameterized model202512,287,584Methods and apparatus for obtaining diagnostic information relating to an industrial process202512,271,114Method and apparatus for predicting substrate image202512,259,659Aligning a distorted image202512,112,260Metrology apparatus and method for determining a characteristic of one or more structures on a substrate202411,966,168Method of measuring variation, inspection system, computer program, and computer system202411,940,740Methods and apparatus for obtaining diagnostic information relating to an industrial process202411,880,640Systems and methods for predicting layer deformation202411,847,570Deep learning for semantic segmentation of pattern202311,720,029Method and apparatus for image analysis202311,625,520Systems and methods for predicting layer deformation202311,442,368Inspection tool, inspection method and computer program product202211,385,550Methods and apparatus for obtaining diagnostic information relating to an industrial process202211,379,970Deep learning for semantic segmentation of pattern202211,143,970Method and apparatus for image analysis2021Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2021–2026Patents assigned to ASML NETHERLANDS BV (17)· patent assignee history
2021–2026Based in NL· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| ASML NETHERLANDS BV | 17 | 2021–2026 |
Locations
| Location | Patents | Span |
|---|---|---|
| NL | 17 | 2021–2026 |