Inventor
Steven W. Mittl
Inventor
Essex, VT, US
Overview
Patents· 14 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Rprimary
G01RMeasuring electric variables19%
H10DInorganic electric semiconductor devices19%
H03KPulse technique16%
G06FElectric digital data processing13%
G16ZInformation and communication technology [ict] specially adapted for specific application fields, not otherwise provided for6%
H01LSemiconductor devices6%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h106%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h106%
G01NInvestigating or analysing materials by determining their chemical or physical properties3%
G11CStatic stores3%
PatentTitleYear
10,170,460Voltage balanced stacked clamp20199,978,743Voltage balanced stacked clamp20189,310,418'Correction for stress induced leakage current in dielectric reliability evaluations'20169,310,424'Monitoring aging of silicon in an integrated circuit device'20168,937,487'Correction for stress induced leakage current in dielectric reliability evaluations'20158,713,490'Managing aging of silicon in an integrated circuit device'20148,587,383'Measuring bias temperature instability induced ring oscillator frequency degradation'20137,123,517'Reprogrammable integrated circuit (IC) with overwritable nonvolatile storage'20066,770,501'Deuterium reservoirs and ingress paths'20046,521,977'Deuterium reservoirs and ingress paths'20036,307,250'Electronic switch for decoupling capacitor'20016,252,275'Silicon-on-insulator non-volatile random access memory device'20015,982,225'Hot electron compensation for improved MOS transistor reliability'19995,634,001'Method to calculate hot-electron test voltage differential for assessing microprocessor reliability'1997Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1997–2019Patents assigned to IBM (14)· patent assignee history
1997–2016Based in Essex, VT, US· patent location history
2001–2019Based in Essex Junction, VT, US· patent location history
2013–2015Patents assigned to MITTL STEVEN W (2)· patent assignee history
2013Patents assigned to BROCHU JR DAVID G (1)· patent assignee history
2013Patents assigned to IOANNOU DIMITRIS P (1)· patent assignee history
2013Patents assigned to MERRILL TRAVIS S (1)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| IBM | 14 | 1997–2019 |
| MITTL STEVEN Wself | 2 | 2013–2015 |
| BROCHU JR DAVID G | 1 | 2013 |
| IOANNOU DIMITRIS P | 1 | 2013 |
| MERRILL TRAVIS S | 1 | 2013 |
Locations
| Location | Patents | Span |
|---|---|---|
| Essex, VT, US | 10 | 1997–2016 |
| Essex Junction, VT, US | 4 | 2001–2019 |