Inventor
Gary Hieftje
Inventor
Bloomington, IN, US
Overview
Patents· 17 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties29%
H01JElectric discharge tubes or discharge lamps29%
B01DSeparation6%
B01LChemical or physical laboratory apparatus for general use3%
B32BLayered products, i.e. products built-up of strata of flat or non-flat, e.g. cellular or honeycomb, form3%
C04BLime, magnesia3%
G01JMeasurement of intensity, velocity, spectral content, polarisation, phase or pulse characteristics of infrared, visible or ultraviolet light3%
G06FElectric digital data processing3%
G06QInformation and communication technology [ict] specially adapted for administrative, commercial, financial, managerial or supervisory purposes3%
G16CComputational chemistry3%
PatentTitleYear
11,133,170Atmospheric-pressure ionization and fragmentation of molecules for structural elucidation202110,784,097Atmospheric-pressure ionization and fragmentation of molecules for structural elucidation20209,607,306'Ambient sampling mass spectrometry and chemometric analysis for screening encapsulated electronic and electrical components for counterfeits'20178,648,295'Combined distance-of-flight and time-of-flight mass spectrometer'20148,604,423'Method for enhancement of mass resolution over a limited mass range for time-of-flight spectrometry'20138,207,494'Laser ablation flowing atmospheric-pressure afterglow for ambient mass spectrometry'20127,929,138'Ambient-atmosphere glow discharge for determination of elemental concentration in solutions in a high-throughput or transient fashion'20117,893,408'Methods and apparatus for ionization and desorption using a glow discharge'20117,768,639'Methods for detecting and correcting inaccurate results in inductively coupled plasma-atomic emission spectrometry'20107,498,585'Method and apparatus for simultaneous detection and measurement of charged particles at one or more levels of particle flux for analysis of same'20097,294,830'Simultaneous acquisition of chemical information'20075,614,711'Time-of-flight mass spectrometer'19975,335,860'Rotary spray chamber device for conditioning aerosols'19944,800,279'Methods and devices for near-infrared evaluation of physical properties of samples'19894,642,778'Method and device for spectral reconstruction'19874,492,322'Device for the accurate dispensing of small volumes of liquid samples'19854,462,685'Spectroanalytical system'1984Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1984–2021Based in Bloomington, IN, US· patent location history
1985–1997Patents assigned to INDIANA UNIVERSITY FOUNDATION (5)· patent assignee history
2007–2021Patents assigned to UNIV INDIANA RES & TECH CORP (7)· patent assignee history
2012–2014Patents assigned to HIEFTJE GARY M (3)· patent assignee history
2012–2014Patents assigned to RAY STEVEN J (3)· patent assignee history
2013–2014Patents assigned to BARINAGA CHARLES J (2)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| UNIV INDIANA RES & TECH CORP | 7 | 2007–2021 |
| INDIANA UNIVERSITY FOUNDATION | 5 | 1985–1997 |
| HIEFTJE GARY Mself | 3 | 2012–2014 |
| RAY STEVEN J | 3 | 2012–2014 |
| BARINAGA CHARLES J | 2 | 2013–2014 |
Locations
| Location | Patents | Span |
|---|---|---|
| Bloomington, IN, US | 17 | 1984–2021 |