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Inventor

Futoshi Ojima

Inventor
Kobe, JP

Overview

3→
Patents
1995–2015
Patent span
Physics
Primary field (CPC G)

Patents· 3 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Rprimary
G01RMeasuring electric variables29%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1029%
G01NInvestigating or analysing materials by determining their chemical or physical properties14%
G01TMeasurement of nuclear or x-radiation14%
H01LSemiconductor devices14%
PatentTitleYear
8,952,338'Crystalline quality evaluation apparatus for thin-film semiconductors, using μ-PCD technique'20155,760,597'Method of and apparatus for measuring lifetime of carriers in semiconductor sample'19985,438,276'Apparatus for measuring the life time of minority carriers of a semiconductor wafer'1995

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1995–2015Patents assigned to KOBE STEEL LTD (3)· patent assignee history
1995Patents assigned to LEO CORP (1)· patent assignee history
1995–2015Based in Kobe, JP· patent location history
1998Patents assigned to GENESIS TECHNOLOGY INC (1)· patent assignee history
2015Patents assigned to INUI MASAHIRO (1)· patent assignee history
2015Patents assigned to KOBELCO RES INST INC (1)· patent assignee history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
KOBE STEEL LTD31995–2015
GENESIS TECHNOLOGY INC11998
INUI MASAHIRO12015
KOBELCO RES INST INC12015
LEO CORP11995
Locations
LocationPatentsSpan
Kobe, JP31995–2015