Inventor
Fadi H. Gebara
Inventor
Austin, TX, US
Overview
Patents· 47 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Rprimary
G01RMeasuring electric variables20%
G06FElectric digital data processing20%
G11CStatic stores13%
H03KPulse technique13%
H03LAutomatic control, starting, synchronisation or stabilisation of generators of electronic oscillations or pulses8%
H02MApparatus for conversion between ac and ac, between ac and dc, or between dc and dc, and for use with mains or similar power supply systems7%
H04LTransmission of digital information, e.g. telegraphic communication7%
H10DInorganic electric semiconductor devices4%
H10BElectronic memory devices3%
Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests3%
PatentTitleYear
9,971,782Document tagging and retrieval using entity specifiers20189,971,828Document tagging and retrieval using per-subject dictionaries including subject-determining-power scores for entries20189,430,559'Document retrieval using internal dictionary-hierarchies to adjust per-subject match results'20169,262,510'Document tagging and retrieval using per-subject dictionaries including subject-determining-power scores for entries'20169,251,136'Document tagging and retrieval using entity specifiers'20169,235,638'Document retrieval using internal dictionary-hierarchies to adjust per-subject match results'20169,009,415'Memory system including a spiral cache'20158,880,954'Temperature-profiled device fingerprint generation and authentication from power-up states of static cells'20148,676,516'Test circuit for bias temperature instability recovery measurements'20148,543,768'Memory system including a spiral cache'20138,539,185'Systolic networks for a spiral cache'20138,495,431'Temperature-profiled device fingerprint generation and authentication from power-up states of static cells'20138,405,129'Structure for high density stable static random access memory'20138,229,683'Test circuit for bias temperature instability recovery measurements'20128,219,857'Temperature-profiled device fingerprint generation and authentication from power-up states of static cells'20128,217,427'High density stable static random access memory'20128,164,942'High performance eDRAM sense amplifier'20128,138,820'Peak power reduction methods in distributed charge pump systems'20128,111,090'Voltage comparator having improved kickback and jitter characteristics'20128,102,194'Dual frequency divider having phase-shifted inputs and outputs'20128,063,424'Embedded photodetector apparatus in a 3D CMOS chip stack'20117,994,845'Switched-capacitor charge pumps'20117,949,482'Delay-based bias temperature instability recovery measurements for characterizing stress degradation and recovery'20117,930,120'System and circuit for determining data signal jitter via asynchronous sampling'20117,881,135'Method for QCRIT measurement in bulk CMOS using a switched capacitor circuit'20117,880,507'Circular edge detector'20117,847,618'Peak power reduction methods in distributed charge pump systems'20107,792,649'System and circuit for constructing a synchronous signal diagram from asynchronously sampled data'20107,760,010'Switched-capacitor charge pumps'20107,759,980'Circular edge detector for measuring timing of data signals'20107,692,480'System to evaluate a voltage in a charge pump and associated methods'20107,684,478'Generating an eye diagram of integrated circuit transmitted signals'20107,667,513'Digital duty cycle corrector'20107,668,037'Storage array including a local clock buffer with programmable timing'20107,570,082'Voltage comparator apparatus and method having improved kickback and jitter characteristics'20097,548,823'Correction of delay-based metric measurements using delay circuits having differing metric sensitivities'20097,542,862'Calibration of multi-metric sensitive delay measurement circuits'20097,525,393'Digital frequency multiplier circuit'20097,478,011'Method and system for measuring signal characteristics of data signals transmitted between integrated circuit chips'20097,394,276'Active cancellation matrix for process parameter measurements'20087,389,192'Determining data signal jitter via asynchronous sampling'20087,383,160'Method and apparatus for constructing a synchronous signal diagram from asynchronously sampled data'20087,321,269'High frequency ring oscillator with feed-forward paths'20087,288,975'Method and apparatus for fail-safe and restartable system clock generation'20077,286,947'Method and apparatus for determining jitter and pulse width from clock signal comparisons'20077,113,048'Ultra high frequency ring oscillator with voltage controlled frequency capabilities'20067,084,689'Method and apparatus for generating non-skewed complementary signals through interpolation'2006Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2006–2018Patents assigned to IBM (47)· patent assignee history
2006–2018Based in Austin, TX, US· patent location history
2006Based in Macomb, MI, US· patent location history
2011–2014Patents assigned to GEBARA FADI H (13)· patent assignee history
2011–2014Patents assigned to SCHAUB JEREMY D (8)· patent assignee history
2012–2013Patents assigned to STRUMPEN VOLKER (4)· patent assignee history
2012Patents assigned to KUANG JENTE B (3)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| IBM | 47 | 2006–2018 |
| GEBARA FADI Hself | 13 | 2011–2014 |
| SCHAUB JEREMY D | 8 | 2011–2014 |
| STRUMPEN VOLKER | 4 | 2012–2013 |
| KUANG JENTE B | 3 | 2012 |
Locations
| Location | Patents | Span |
|---|---|---|
| Austin, Texas, US | 46 | 2006–2018 |
| Macomb, MI, US | 1 | 2006 |