Inventor
James Jianguo Xu
Inventor
San Jose, CA, US
Overview
Patents· 22 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G02Bprimary
G02BOptical elements, systems or apparatus29%
G01NInvestigating or analysing materials by determining their chemical or physical properties16%
G06TImage data processing or generation, in general16%
H04NPictorial communication, e.g. television12%
G06KGraphical data reading6%
G01BMeasuring length, thickness or similar linear dimensions4%
G01JMeasurement of intensity, velocity, spectral content, polarisation, phase or pulse characteristics of infrared, visible or ultraviolet light4%
G01RMeasuring electric variables2%
G02FOptical devices or arrangements for the control of light by modification of the optical properties of the media of the elements involved therein2%
G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices2%
PatentTitleYear
10,769,769Dual mode inspector202010,475,173Dual mode inspector201910,359,613Optical measurement of step size and plated metal thickness201910,209,5013D microscope and methods of measuring patterned substrates201910,168,524Optical measurement of bump hieght201910,157,457Optical measurement of opening dimensions in a wafer201810,048,4803D microscope including insertable components to provide multiple imaging and measurement capabilities20189,664,888'Multi-surface optical 3D microscope'20179,645,381'Multi-surface optical 3D microscope'20179,389,408'3D microscope and methods of measuring patterned substrates'20169,036,869'Multi-surface optical 3D microscope'20158,976,366'System and method for monitoring LED chip surface roughening process'20158,184,364'Illuminator for a 3-D optical microscope'20128,174,762'3-D optical microscope'20127,944,609'3-D optical microscope'20117,729,049'3-d optical microscope'20107,433,031'Defect review system with 2D scanning and a ring detector'20087,110,106'Surface inspection system'20067,043,101'Integrated optical pump module'20066,069,690'Integrated laser imaging and spectral analysis system'20005,912,735'Laser/white light viewing laser imaging system'19995,761,336'Aperture optimization method providing improved defect detection and characterization'1998Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1998–1999Based in Sunnyvale, CA, US· patent location history
1999–2020Patents assigned to KLA TENCOR CORP (6)· patent assignee history
2000–2020Based in San Jose, CA, US· patent location history
2006Based in Fremont, CA, US· patent location history
2010–2020Patents assigned to ZETA INSTR INC (15)· patent assignee history
2012–2018Patents assigned to LEE KEN KINSUN (6)· patent assignee history
2012–2018Patents assigned to XU JAMES JIANGUO (6)· patent assignee history
2015–2018Patents assigned to HOU ZHEN (4)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| ZETA INSTR INC | 15 | 2010–2020 |
| KLA TENCOR CORP | 6 | 1999–2020 |
| LEE KEN KINSUN | 6 | 2012–2018 |
| XU JAMES JIANGUOself | 6 | 2012–2018 |
| HOU ZHEN | 4 | 2015–2018 |
Locations
| Location | Patents | Span |
|---|---|---|
| San Jose, California, US | 19 | 2000–2020 |
| Sunnyvale, California, US | 2 | 1998–1999 |
| Fremont, California, US | 1 | 2006 |