Inventor
Dieter Rathei
Inventor
Graz, AT
Overview
Patents· 8 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
H10Pprimary
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1040%
G05BControl or regulating systems in general20%
G11CStatic stores20%
G01RMeasuring electric variables10%
Y02PClimate change mitigation technologies in the production or processing of goods10%
PatentTitleYear
7,587,292'Method of monitoring a semiconductor manufacturing trend'20097,524,683'Method of monitoring a semiconductor manufacturing trend'20097,496,478'Method of monitoring a semiconductor manufacturing trend'20097,003,432'Method of and system for analyzing cells of a memory device'20066,963,813'Method and apparatus for fast automated failure classification for semiconductor wafers'20056,717,431'Method for semiconductor yield loss calculation'20046,553,521'Method for efficient analysis semiconductor failures'20036,367,040'System and method for determining yield impact for semiconductor devices'2002Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2002Patents assigned to SIEMENS AG (1)· patent assignee history
2002–2003Based in Glen Allen, VA, US· patent location history
2003–2006Patents assigned to INFINEON TECHNOLOGIES RICHMOND (3)· patent assignee history
2004–2009Based in Graz, AT· patent location history
2005–2009Patents assigned to RATHEI DIETER (4)· patent assignee history
2005Patents assigned to HLADSCHIK THOMAS (1)· patent assignee history
2005Patents assigned to OSWALD PETER (1)· patent assignee history
2005Based in Paris, FR· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| RATHEI DIETERself | 4 | 2005–2009 |
| INFINEON TECHNOLOGIES RICHMOND | 3 | 2003–2006 |
| HLADSCHIK THOMAS | 1 | 2005 |
| OSWALD PETER | 1 | 2005 |
| SIEMENS AG | 1 | 2002 |
Locations
| Location | Patents | Span |
|---|---|---|
| Graz, AT | 5 | 2004–2009 |
| Glen Allen, Virginia, US | 2 | 2002–2003 |
| Paris, FR | 1 | 2005 |