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Inventor

Jay Jianhui Chen

Inventor
Fremont, CA, US

Overview

4→
Patents
2012–2020
Patent span
Physics
Primary field (CPC G)

Patents· 4 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties30%
G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices30%
B82YSpecific uses or applications of nanostructures10%
G01BMeasuring length, thickness or similar linear dimensions10%
H01JElectric discharge tubes or discharge lamps10%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1010%
PatentTitleYear
10,551,750Metrology method and apparatus and associated computer product202010,310,388Metrology method and apparatus and associated computer product20199,903,823'Metrology method and apparatus'20188,094,428'Wafer grounding methodology'2012

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

2012Patents assigned to CHEN JAY (1)· patent assignee history
2012Patents assigned to DOU JUYING (1)· patent assignee history
2012Patents assigned to FAN ZHENG (1)· patent assignee history
2012Patents assigned to HERMES MICROVISION INC (1)· patent assignee history
2012–2020Based in Fremont, CA, US· patent location history
2018–2020Patents assigned to ASML NETHERLANDS BV (3)· patent assignee history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
ASML NETHERLANDS BV32018–2020
CHEN JAYself12012
DOU JUYING12012
FAN ZHENG12012
HERMES MICROVISION INC12012
Locations
LocationPatentsSpan
Fremont, California, US42012–2020