Inventor
Yuichiro Shimizu
Inventor
Nagano, JP
Overview
Patents· 27 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Rprimary
G01RMeasuring electric variables9%
C21DModifying the physical structure of ferrous metals7%
C23CCoating metallic material7%
H05KPrinted circuits7%
C22CAlloys6%
F02NStarting of combustion engines6%
G01NInvestigating or analysing materials by determining their chemical or physical properties6%
H01LSemiconductor devices6%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h106%
F02DControlling combustion engines4%
PatentTitleYear
10,385,439Nitriding process method of steel member201910,386,387Probe guide plate and probe device201910,309,988Probe guide plate and probe device201910,261,110Probe guide plate having a silicon oxide layer formed on surfaces and on an inner wall of a through hole thereof, and a protective insulating layer formed on the silicon oxide layer, and probe apparatus including the probe guide plate201910,139,430Probe guide, probe card, and method for probe guide manufacturing20189,988,704Manufacturing method of nitrided steel member20189,859,201'Wiring substrate, semiconductor device, and method for manufacturing wiring substrate'20189,829,509Probe guide plate and semiconductor inspection apparatus20179,783,879'Nitrided steel member and manufacturing method thereof'20179,746,433'X-ray fluorescence spectrometer and X-ray fluorescence analyzing method'20179,598,760'Nitrided steel member and manufacturing method thereof'20179,392,705'Wiring board with through wiring'20169,232,644'Wiring substrate'20169,080,993'Microdevice, microchip apparatus and analysis method utilizing the same'20159,054,579'Power supply circuit'20159,040,832'Wiring substrate and method of manufacturing the same'20159,014,942'Idling stop device and idling stop control method'20158,887,684'Idling stop apparatus and method for disabling idling stop function'20148,819,401'Semiconductor device and reset control method in semiconductor device'20148,702,963'Electrochemical measurement electrode, electrochemical measurement electrode chip, and electrochemical measuring method and analysis method using the same'20148,674,533'Engine control device, vehicle, and engine control method'20148,493,095'Semiconductor device with clock stop detection'20138,030,027'Method for enhancing recombinant antibody production'20117,977,569'Dye sensitized solar cell module and manufacturing method thereof'20117,800,878'Power supply control circuit, and electronic control device, power supplying circuit, and power control integrated circuit equipped with power supply control circuit'20107,684,468'Wireless communication device'20107,213,097'Electronic control unit and electronic driving unit'2007Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2007–2015Patents assigned to FUJITSU TEN LTD (6)· patent assignee history
2010–2015Based in Kobe, JP· patent location history
2011–2019Patents assigned to SHINKO ELECTRIC IND CO (10)· patent assignee history
2011–2019Based in Nagano, JP· patent location history
2013–2017Patents assigned to SHIMIZU YUICHIRO (9)· patent assignee history
2013–2014Based in Yokohama, JP· patent location history
2014–2015Based in Osaka, JP· patent location history
2017–2019Patents assigned to DOWA THERMOTECH CO LTD (4)· patent assignee history
2017–2019Patents assigned to HONDA MOTOR CO LTD (4)· patent assignee history
2017–2019Based in Tokyo, JP· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| SHINKO ELECTRIC IND CO | 10 | 2011–2019 |
| SHIMIZU YUICHIROself | 9 | 2013–2017 |
| FUJITSU TEN LTD | 6 | 2007–2015 |
| DOWA THERMOTECH CO LTD | 4 | 2017–2019 |
| HONDA MOTOR CO LTD | 4 | 2017–2019 |
Locations
| Location | Patents | Span |
|---|---|---|
| Nagano, JP | 10 | 2011–2019 |
| Kobe, JP | 5 | 2010–2015 |
| Tokyo, JP | 4 | 2017–2019 |
| Osaka, JP | 2 | 2014–2015 |
| Yokohama, JP | 2 | 2013–2014 |