Inventor
Bao G. Tran
Inventor
Houston, TX, US
Overview
Patents· 8 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G11Cprimary
G11CStatic stores38%
G01RMeasuring electric variables25%
G06FElectric digital data processing25%
G02BOptical elements, systems or apparatus13%
PatentTitleYear
5,825,194'Large integrated circuit with modulator probe structures'19985,648,730'Large integrated circuit with modular probe structures'19974,868,823'High speed concurrent testing of dynamic read/write memory array'19894,757,523'High speed testing of integrated circuit'19884,661,930'High speed testing of integrated circuit'19874,658,382'Dynamic memory with improved dummy cell circuitry'19874,654,849'High speed concurrent testing of dynamic read/write memory array'19874,618,947'Dynamic memory with improved address counter for serial modes'1986Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1986–1998Patents assigned to TEXAS INSTRUMENTS INC (8)· patent assignee history
1986–1989Based in Houston, TX, US· patent location history
1997–1998Based in Richardson, TX, US· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| TEXAS INSTRUMENTS INC | 8 | 1986–1998 |
Locations
| Location | Patents | Span |
|---|---|---|
| Houston, Texas, US | 6 | 1986–1989 |
| Richardson, Texas, US | 2 | 1997–1998 |