Inventor
Lawrence Scipioni
Inventor
Beaverton, OR, US
Overview
Patents· 18 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
H01Jprimary
H01JElectric discharge tubes or discharge lamps59%
G01NInvestigating or analysing materials by determining their chemical or physical properties10%
B82YSpecific uses or applications of nanostructures7%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h107%
B81CProcesses or apparatus specially adapted for the manufacture or treatment of microstructural devices or systems3%
G21KHandling of particles or ionising radiation not otherwise provided for3%
H05KPrinted circuits3%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h103%
Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests3%
PatentTitleYear
9,640,367'Plasma source for a focused ion beam system'20178,907,277'Reducing particle implantation'20148,829,468'Magnetically enhanced, inductively coupled plasma source for a focused ion beam system'20148,455,840'Gas field ion microscopes having multiple operation modes'20138,399,864'Dual beam system'20138,384,029'Cross-section systems and methods'20138,334,701'Repairing defects'20128,168,957'Magnetically enhanced, inductively coupled plasma source for a focused ion beam system'20128,013,311'Dual beam system'20118,013,300'Sample decontamination'20117,670,455'Magnetically enhanced, inductively coupled plasma source for a focused ion beam system'20107,601,976'Dual beam system'20097,544,523'Method of fabricating nanodevices'20097,241,361'Magnetically enhanced, inductively coupled plasma source for a focused ion beam system'20077,161,159'Dual beam system'20077,160,475'Fabrication of three dimensional structures'20076,838,668'System for imaging a cross-section of a substrate'20056,727,500'System for imaging a cross-section of a substrate'2004Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2004–2017Patents assigned to FEI CO (13)· patent assignee history
2004–2007Based in Danvers, MA, US· patent location history
2007–2014Based in Beaverton, OR, US· patent location history
2011–2013Patents assigned to ZEISS CARL NTS LLC (3)· patent assignee history
2011–2017Based in Bedford, MA, US· patent location history
2012–2014Patents assigned to SCIPIONI LAWRENCE (7)· patent assignee history
2012–2014Patents assigned to KNIPPELMEYER RAINER (3)· patent assignee history
2012–2014Patents assigned to BOSWELL RODERICK (2)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| FEI CO | 13 | 2004–2017 |
| SCIPIONI LAWRENCEself | 7 | 2012–2014 |
| KNIPPELMEYER RAINER | 3 | 2012–2014 |
| ZEISS CARL NTS LLC | 3 | 2011–2013 |
| BOSWELL RODERICK | 2 | 2012–2014 |
Locations
| Location | Patents | Span |
|---|---|---|
| Beaverton, OR, US | 9 | 2007–2014 |
| Bedford, Massachusetts, US | 6 | 2011–2017 |
| Danvers, Massachusetts, US | 3 | 2004–2007 |