Inventor

Ravinder Prakash

Inventor
Concord, NC, US

Overview

41→
Patents
1980–2012
Patent span
Physics
Primary field (CPC G)

Patents· 41 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G06Vprimary
G06VImage or video recognition or understanding29%
H04NPictorial communication, e.g. television26%
G06TImage data processing or generation, in general19%
G02BOptical elements, systems or apparatus8%
G06KGraphical data reading6%
G06QInformation and communication technology [ict] specially adapted for administrative, commercial, financial, managerial or supervisory purposes5%
B41JTypewriters2%
G01BMeasuring length, thickness or similar linear dimensions2%
G03GElectrography2%
H01QAntennas, i.e. radio aerials2%
PatentTitleYear
8,136,721'Enhanced check code line image capture for improved OCR'20128,023,719'MICR reader using phase angle extracted from frequency domain analysis'20117,983,984'Electronic endorsement of check images'20117,961,930'Recursive image filtering'20117,952,775'Gray scale image cleaning system and method'20117,885,474'Solution for detecting a streak in a compressed gray scale image'20117,830,552'Black white image scaling having print density control and polarity detection'20107,818,245'Electronic endorsement of check images'20107,809,213'Black white image compression having print density control'20107,796,798'Frequency domain based MICR reader'20107,706,004'Apparatus and system for scanning maintenance prediction'20107,684,646'System and method of determining image skew using connected components'20107,593,600'Black white image scaling for optical character recognition'20097,570,835'Edge smoothing filter for character recognition'20097,567,725'Edge smoothing filter for character recognition'20097,522,761'System and method for detecting a streak in a compressed gray scale image'20097,519,214'System and method of determining image skew using connected components'20097,515,758'Black white image compression having print density control'20097,499,580'System for determining image resolution using MICR characters'20097,492,974'Gray scale image cleaning system and method'20097,480,403'Apparatus, system, and method for fraud detection using multiple scan technologies'20097,454,068'System and method for providing black white image compression'20087,388,681'Method for scanning maintenance prediction'20087,386,160'System and method for determining image resolution using MICR characters'20087,362,908'Adaptive generation of Q-table2 for improved image quality'20087,336,813'System and method of determining image skew using connected components'20087,289,679'System and method for measuring image quality using compressed image data'20077,257,238'System, apparatus, and method for image scanning quality adjustment'20077,239,748'System and method for segmenting an electronic image'20077,120,303'Adaptive generation of Q-table2 for improved image quality'20066,686,956'Increased resolution digital capture device'20045,963,654'Apparatus and method for monitoring performance of an image capture device'19995,692,065'Apparatus and method for determining image quality'19975,380,999'Linear scanning using a single illumination and imaging optic stations with a first pair of parallel mirrors and a second pair of mirrors extending into paths of light beams'19955,214,536'Illumination device for a document line scanner'19935,168,167'Optical scanner having controllable light sources'19925,119,113'Spot-defined exposure system for a laser printer'19925,002,375'Variable pel density print head for electrophotographic printers'19914,884,857'Scanner for use in multiple spot laser electrophotographic printer'19894,804,981'Aspheric lens for polygon mirror tilt error correction and scan bow correction in an electrophotographic printer'19894,199,257'Projected reticle optical sighting system'1980

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1980Patents assigned to SIERRA RESEARCH CORP (1)· patent assignee history
1980Based in Cheektowaga, NY, US· patent location history
1989–2012Patents assigned to IBM (40)· patent assignee history
1989–2012Based in Concord, NC, US· patent location history
1989Based in Ardsley, NY, US· patent location history
2012Patents assigned to JOURNEY JEFFREY E (1)· patent assignee history
2012Patents assigned to PRAKASH RAVINDER (1)· patent assignee history
2012Patents assigned to ROHE CLAIR F (1)· patent assignee history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
IBM401989–2012
JOURNEY JEFFREY E12012
PRAKASH RAVINDERself12012
ROHE CLAIR F12012
SIERRA RESEARCH CORP11980
Locations
LocationPatentsSpan
Concord, NC, US391989–2012
Ardsley, New York, US11989
Cheektowaga, New York, US11980