Inventor
Atsuya Niwano
Inventor
Tokyo, JP
Overview
Patents· 14 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Bprimary
G01BMeasuring length, thickness or similar linear dimensions22%
LOC1019%
G01DMeasuring not specially adapted for a specific variable11%
G06FElectric digital data processing11%
LOC1411%
G08CTransmission systems for measured values, control or similar signals7%
G09GArrangements or circuits for control of indicating devices using static means to present variable information7%
G02BOptical elements, systems or apparatus4%
H01RElectrically-conductive connections4%
H04QSelecting4%
PatentTitleYear
10,598,524Measuring instrument that detects displacement of a contact point202010,467,991Measurement instrument and reflection device used for same201910,451,450External device for measuring instrument201910,283,922Connection unit for connecting external device to measurement device and measurement device optional system using the connection unit2019D0825557Wireless communication device2018D0821393Wireless communication device2018D0819631Connection device for communication20189,798,445'Measuring instrument'2017D0790379'Digital dial gauge'20179,372,059'Micrometer'2016D0747988'Digital dial gauge'2016D0747987'Display plate for measurement'2016D0740143'Micrometer'2015D0729659'Micrometer'2015Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2015–2020Patents assigned to MITUTOYO CORP (14)· patent assignee history
2015–2016Based in Kawasaki, JP· patent location history
2016Based in Kanagawa, JP· patent location history
2017–2020Based in Tokyo, JP· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| MITUTOYO CORP | 14 | 2015–2020 |
Locations
| Location | Patents | Span |
|---|---|---|
| Tokyo, JP | 9 | 2017–2020 |
| Kawasaki, JP | 4 | 2015–2016 |
| Kanagawa, JP | 1 | 2016 |