Inventor

Burnell G. West

Inventor

Fremont, CA, US

Overview

37→

Patents

1985–2010

Patent span

Physics

Primary field (CPC G)

Patents· 37 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Rprimary

G01RMeasuring electric variables49%

H03KPulse technique20%

G11CStatic stores14%

G06FElectric digital data processing8%

G04FTime-interval measuring2%

G05DSystems for controlling or regulating non-electric variables2%

H03LAutomatic control, starting, synchronisation or stabilisation of generators of electronic oscillations or pulses2%

H04LTransmission of digital information, e.g. telegraphic communication2%

H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h102%

PatentTitleYear

7,765,443'Test systems and methods for integrated circuit devices'2010 7,761,751'Test and diagnosis of semiconductors'2010 7,454,678'Scan stream sequencing for testing integrated circuits'2008 7,336,066'Reduced pin count test method and apparatus'2008 7,222,280'Diagnostic process for automated test equipment'2007 7,212,941'Non-deterministic protocol packet testing'2007 7,171,598'Tester system having a multi-purpose memory'2007 7,143,326'Test system algorithmic program generators'2006 7,113,886'Circuit and method for distributing events in an event stream'2006 7,093,177'Low-jitter clock for test system'2006 7,035,755'Circuit testing with ring-connected test instrument modules'2006 7,017,091'Test system formatters configurable for multiple data rates'2006 6,940,271'Pin electronics interface circuit'2005 6,937,006'Pin electronics interface circuit'2005 6,928,387'Circuit and method for distributing events in an event stream'2005 6,859,902'Method and apparatus for high speed IC test interface'2005 6,748,564'Scan stream sequencing for testing integrated circuits'2004 6,622,107'Edge placement and jitter measurement for electronic elements'2003 6,501,706'Time-to-digital converter'2002 6,285,963'Measuring signals in a tester system'2001 6,128,754'Tester having event generation circuit for acquiring waveform by supplying strobe events for waveform acquisition rather than using strobe events specified by the test program'2000 6,081,484'Measuring signals in a tester system'2000 6,025,736'Fast reprogrammable logic with active links between cells'2000 6,014,764'Providing test vectors with pattern chaining definition'2000 6,002,268'FPGA with conductors segmented by active repeaters'1999 5,668,495'BiCMOS reprogrammable logic'1997 5,570,059'BiCMOS multiplexers and crossbar switches'1996 5,477,139'Event sequencer for automatic test equipment'1995 5,475,624'Test generation by environment emulation'1995 5,430,400'Driver circuits for IC tester'1995 5,406,133'BICMOS reprogrammable logic'1995 5,397,943'Clock distribution method and apparatus for high speed circuits with low skew using counterpropaging true and complement re-generated clock signals with predetermined ramp shapes'1995 5,355,035'High speed BICMOS switches and multiplexers'1994 5,212,443'Event sequencer for automatic test equipment'1993 4,849,702'Test period generator for automatic test equipment'1989 4,550,405'Deskew circuit for automatic test equipment'1985 4,497,998'Temperature stabilized stop-restart oscillator'1985

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1985Patents assigned to FAIRCHILD CAMERA INSTR CO (2)· patent assignee history

1985–2006Based in Fremont, CA, US· patent location history

1993–2006Patents assigned to SCHLUMBERGER TECHNOLOGIES INC (9)· patent assignee history

1994–1997Based in Freemont, CA, US· patent location history

1995–1996Patents assigned to DYNA LOGIC CORP (3)· patent assignee history

1997–1999Patents assigned to DYNACHIP CORP (2)· patent assignee history

2005–2010Patents assigned to CREDENCE SYSTEMS CORP (14)· patent assignee history

2005–2010Based in Half Moon Bay, CA, US· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees

Assignee	Patents	Span
CREDENCE SYSTEMS CORP	14	2005–2010
SCHLUMBERGER TECHNOLOGIES INC	9	1993–2006
DYNA LOGIC CORP	3	1995–1996
DYNACHIP CORP	2	1997–1999
FAIRCHILD CAMERA INSTR CO	2	1985

Locations

Location	Patents	Span
Fremont, California, US	22	1985–2006
Half Moon Bay, California, US	11	2005–2010
Freemont, California, US	4	1994–1997