Inventor
Chiyan Kuan
Inventor
Danville, CA, US
Overview
Patents· 17 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
H01Jprimary
H01JElectric discharge tubes or discharge lamps33%
G01NInvestigating or analysing materials by determining their chemical or physical properties28%
H05FStatic electricity15%
G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices9%
G06TImage data processing or generation, in general7%
G06VImage or video recognition or understanding4%
G06KGraphical data reading2%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h102%
PatentTitleYear
10,775,325Method and system for inspecting an EUV mask202010,088,438Method and system for inspecting an EUV mask201810,054,556Structure electron beam inspection system for inspecting extreme ultraviolet mask and structure for discharging extreme ultraviolet mask20189,859,089'Method and system for inspecting and grounding an EUV mask'20189,572,237'Structure electron beam inspection system for inspecting extreme ultraviolet mask and structure for discharging extreme ultraviolet mask'20179,485,846'Method and system for inspecting an EUV mask'20169,436,985'Method and system for enhancing image quality'20169,177,758'Charged particle beam apparatus'20159,164,399'Reticle operation system'20159,113,538'Structure electron beam inspection system for inspecting extreme ultraviolet mask and structure for discharging extreme ultraviolet mask'20159,002,097'Method and system for enhancing image quality'20158,692,193'Method for inspecting EUV reticle and apparatus thereof'20148,575,573'Structure for discharging extreme ultraviolet mask'20138,519,333'Charged particle system for reticle/wafer defects inspection and review'20138,295,580'Substrate and die defect inspection method'20128,217,349'Method for inspecting EUV reticle and apparatus thereof'20127,115,866'Site stepping for electron beam micro analysis'2006Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2006–2018Based in Danville, CA, US· patent location history
2012–2018Patents assigned to HERMES MICROVISION INC (15)· patent assignee history
2012–2014Patents assigned to KUAN CHIYAN (5)· patent assignee history
2012–2014Patents assigned to WANG YOU-JIN (3)· patent assignee history
2012–2014Patents assigned to FANG WEI (2)· patent assignee history
2013Patents assigned to PAN CHUNG-SHIH (2)· patent assignee history
2016–2020Based in San Jose, CA, US· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| HERMES MICROVISION INC | 15 | 2012–2018 |
| KUAN CHIYANself | 5 | 2012–2014 |
| WANG YOU-JIN | 3 | 2012–2014 |
| FANG WEI | 2 | 2012–2014 |
| PAN CHUNG-SHIH | 2 | 2013 |
Locations
| Location | Patents | Span |
|---|---|---|
| Danville, California, US | 14 | 2006–2018 |
| San Jose, California, US | 3 | 2016–2020 |