Inventor
Eiichi Goto
Inventor
Fujisawa, JP
Overview
Patents· 21 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
Y10Sprimary
Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests26%
G01RMeasuring electric variables23%
H03KPulse technique17%
H01JElectric discharge tubes or discharge lamps14%
C12MApparatus for enzymology or microbiology3%
F25BRefrigeration machines, plants or systems3%
G01NInvestigating or analysing materials by determining their chemical or physical properties3%
G02BOptical elements, systems or apparatus3%
G06KGraphical data reading3%
G06VImage or video recognition or understanding3%
PatentTitleYear
9,766,445'Cell suction support system'20175,640,112'Clock signal distributing system'19975,294,884'High sensitive and high response magnetometer by the use of low inductance superconducting loop including a negative inductance generating means'19945,252,921'Noise canceling high-sensitive magnetometer'19935,243,276'Sampling type measuring device'19935,184,072'Apparatus for measuring weak static magnetic field using superconduction strips and a SQUID magnetometer'19935,181,383'Refrigerator'19935,170,115'Sampling type measuring device'19925,151,617'Superconducting logic circuit'19925,053,707'Apparatus for positioning a pick-up coil for detecting magnetic flux quantum trapped in a superconductor'19914,916,335'Superconducting circuit'19904,866,373'Superconducting current detecting circuit employing DC flux parametron circuit'19894,851,776'Weak field measuring magnetometer with flux modulated current conducting Josephson junction'19894,785,426'Superconducting switching circuit, memory cell and memory circuit, with resonance damping resistors'19884,623,804'Fluxoid type superconducting logic element'19864,567,383'Fluxoid type superconducting logic element'1986RE031630'Electron beam exposure system'19844,182,958'Method and apparatus for projecting a beam of electrically charged particles'19804,151,422'Electron beam exposure method'19794,117,340'Electron beam exposure system'19784,112,305'Method of projecting a beam of charged particles'1978Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1978–1997Patents assigned to RIKAGAKU KENKYUSHO (8)· patent assignee history
1978–1997Based in Fujisawa, JP· patent location history
1986Based in Wako, JP· patent location history
1988–1997Patents assigned to HITACHI LTD (3)· patent assignee history
1990–1994Patents assigned to JAPAN RES DEV CORP (6)· patent assignee history
1991–1993Patents assigned to YUYAMA JUNPEI (3)· patent assignee history
1992–2017Patents assigned to YOKOGAWA ELECTRIC CORP (3)· patent assignee history
1992–2017Based in Tokyo, JP· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| RIKAGAKU KENKYUSHO | 8 | 1978–1997 |
| JAPAN RES DEV CORP | 6 | 1990–1994 |
| HITACHI LTD | 3 | 1988–1997 |
| YOKOGAWA ELECTRIC CORP | 3 | 1992–2017 |
| YUYAMA JUNPEI | 3 | 1991–1993 |
Locations
| Location | Patents | Span |
|---|---|---|
| Fujisawa, JP | 16 | 1978–1997 |
| Tokyo, JP | 3 | 1992–2017 |
| Wako, JP | 2 | 1986 |