Inventor
Wolfgang Osten
Inventor
Stuttgart, DE
Overview
Patents· 15 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Bprimary
G01BMeasuring length, thickness or similar linear dimensions43%
A61BDiagnosis7%
G01NInvestigating or analysing materials by determining their chemical or physical properties7%
G02BOptical elements, systems or apparatus7%
B05CApparatus for applying fluent materials to surfaces, in general3%
B05DProcesses for applying fluent materials to surfaces, in general3%
G01DMeasuring not specially adapted for a specific variable3%
G01JMeasurement of intensity, velocity, spectral content, polarisation, phase or pulse characteristics of infrared, visible or ultraviolet light3%
G01LMeasuring force, stress, torque, work, mechanical power, mechanical efficiency, or fluid pressure3%
G01MTesting static or dynamic balance of machines or structures3%
PatentTitleYear
10,612,905Interferometer using tilted object waves and comprising a Fizeau interferometer objective202010,481,020Optical method and arrangement for measuring residual stresses, in particular in coated objects201910,323,938Method for calibrating a measuring device201910,066,997Method and device for generating multispectral or hyperspectral light, for hyperspectral imaging and/or for distance measurement and/or 2D or 3D profile measurement of an object by means of spectrometry20189,772,275'Method and apparatus for optical absorption measurements'20179,739,594'Robust one-shot interferometer'20179,383,306'Apparatus and a method for spectroscopic ellipsometry, in particular infrared spectroscopic ellipsometry'20169,175,954'Method and arrangement for short coherence holography'20159,068,862'Device and method for optically compensating for the measuring track decentralization in rotation angle sensors'20158,934,104'Method and arrangement for robust interferometry for detecting a feature of an object'20158,804,123'Inspection method and apparatus, lithographic apparatus, lithographic processing cell and device manufacturing method'20148,605,289'Method and apparatus for interferometry'20137,876,446'Method and assembly for confocal, chromatic, interferometric and spectroscopic scanning of optical, multi-layer data memories'20117,787,132'Method and arrangement for a rapid and robust chromatic confocal 3D measurement technique'20107,486,394'Optical measuring head'2009Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2009–2019Patents assigned to CARL MAHR HOLDING GMBH (2)· patent assignee history
2009Based in Lilienthal, DE· patent location history
2010–2020Based in Stuttgart, DE· patent location history
2011–2020Patents assigned to UNIV STUTTGART (11)· patent assignee history
2013–2015Patents assigned to OSTEN WOLFGANG (4)· patent assignee history
2013–2015Patents assigned to KOERNER KLAUS (3)· patent assignee history
2015Patents assigned to PRUSS CHRISTOF (2)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| UNIV STUTTGART | 11 | 2011–2020 |
| OSTEN WOLFGANGself | 4 | 2013–2015 |
| KOERNER KLAUS | 3 | 2013–2015 |
| CARL MAHR HOLDING GMBH | 2 | 2009–2019 |
| PRUSS CHRISTOF | 2 | 2015 |
Locations
| Location | Patents | Span |
|---|---|---|
| Stuttgart, DE | 14 | 2010–2020 |
| Lilienthal, DE | 1 | 2009 |