Inventor

Noam Dotan

Inventor

Givataim, IL

Overview

24→

Patents

1993–2020

Patent span

Physics

Primary field (CPC G)

Patents· 24 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Nprimary

G01NInvestigating or analysing materials by determining their chemical or physical properties32%

H01JElectric discharge tubes or discharge lamps17%

H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1013%

G06TImage data processing or generation, in general6%

G02BOptical elements, systems or apparatus4%

G02FOptical devices or arrangements for the control of light by modification of the optical properties of the media of the elements involved therein4%

Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests4%

E21BEarth or rock drilling2%

F04BPositive-displacement machines for liquids2%

G01RMeasuring electric variables2%

PatentTitleYear

10,753,355Borehole pump and method of using the same2020 7,961,763'System for detection of wafer defects'2011 7,843,559'System for detection of wafer defects'2010 7,813,541'Method and apparatus for detecting defects in wafers'2010 7,804,590'Multi mode inspection method and apparatus'2010 7,633,041'Apparatus for determining optimum position of focus of an imaging system'2009 7,525,659'System for detection of water defects'2009 7,480,039'Multi mode inspection method and apparatus'2009 7,477,383'System for detection of wafer defects'2009 7,274,444'Multi mode inspection method and apparatus'2007 7,260,298'Fiber optical illumination system'2007 7,180,586'System for detection of wafer defects'2007 6,892,013'Fiber optical illumination system'2005 6,627,886'Secondary electron spectroscopy method and system'2003 6,521,891'Focusing method and system'2003 6,407,386'System and method for automatic analysis of defect material on semiconductors'2002 6,407,373'Apparatus and method for reviewing defects on an object'2002 6,353,222'Determining defect depth and contour information in wafer structures using multiple SEM images'2002 6,215,895'Apparatus and method for display panel inspection'2001 6,201,240'SEM image enhancement using narrow band detection and color assignment'2001 6,194,718'Method for reducing aliasing effects in scanning beam microscopy'2001 5,771,068'Apparatus and method for display panel inspection'1998 5,659,172'Reliable defect detection using multiple perspective scanning electron microscope images'1997 5,216,479'Optical inspection system for distinguishing between first and second components in a laminate'1993

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1993–2010Based in Givatayim, IL· patent location history

1998–2001Patents assigned to ORBOTECH LTD (2)· patent assignee history

2001–2003Patents assigned to APPLIED MATERIALS INC (7)· patent assignee history

2001Based in Givaetain, IL· patent location history

2002–2011Based in Givataim, IL· patent location history

2002–2003Based in Givaataim, IL· patent location history

2005–2009Patents assigned to NEGEVTECH LTD (7)· patent assignee history

2009–2010Patents assigned to APPLIED MATERIALS SOUTH EAST A (3)· patent assignee history

2010–2011Patents assigned to APPLIED MATERIALS SEA PTE LTD (2)· patent assignee history

2020Based in Givat Yeshayahu, IL· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees

Assignee	Patents	Span
APPLIED MATERIALS INC	7	2001–2003
NEGEVTECH LTD	7	2005–2009
APPLIED MATERIALS SOUTH EAST A	3	2009–2010
APPLIED MATERIALS SEA PTE LTD	2	2010–2011
ORBOTECH LTD	2	1998–2001

Locations

Location	Patents	Span
Givataim, IL	10	2002–2011
Givatayim, IL	10	1993–2010
Givaataim, IL	2	2002–2003
Givat Yeshayahu, IL	1	2020
Givaetain, IL	1	2001