Inventor
Hiroyuki Kishihara
Inventor
Kyoto, JP
Overview
Patents· 21 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
A61Bprimary
A61BDiagnosis16%
H10FInorganic semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation16%
G01NInvestigating or analysing materials by determining their chemical or physical properties11%
H01LSemiconductor devices11%
G01TMeasurement of nuclear or x-radiation9%
G01JMeasurement of intensity, velocity, spectral content, polarisation, phase or pulse characteristics of infrared, visible or ultraviolet light5%
G21KHandling of particles or ionising radiation not otherwise provided for5%
H10NElectric solid-state devices not otherwise provided for5%
Y02EReduction of greenhouse gas [ghg] emissions, related to energy generation, transmission or distribution5%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h104%
PatentTitleYear
10,859,512X-ray phase contrast imaging apparatus202010,772,592X-ray phase contrast imaging apparatus202010,729,398Radiation phase contrast imaging device202010,468,365Semiconductor device and semiconductor detector, methods for manufacturing same, and semiconductor chip or substrate201910,441,234Radiation-phase-contrast imaging device201910,365,235Radiation phase-contrast imaging device201910,335,109Radiation phase-contrast imaging device201910,276,276Radiation phase-contrast image capturing device201910,254,417Semiconductor detector20199,985,150Radiation detector and method of manufacturing the same20189,306,108'Radiation detector'20168,895,341'Method of manufacturing radiation detector'20148,871,552'Method of manufacturing radiation detector'20148,760,544'Light or radiation image pickup apparatus'20148,563,940'Radiation detector manufacturing method, a radiation detector, and a radiographic apparatus'20138,405,037'Radiation detector manufacturing method, a radiation detector, and a radiographic apparatus'20137,301,155'Radiation detector and radiation imaging apparatus and method for producing radiation detector'20076,674,081'Infrared detecting element, infrared two-dimensional image sensor, and method of manufacturing the same'20046,635,495'Infrared detecting element, infrared two-dimensional image sensor, and method of manufacturing the same'20036,576,566'Apparatus and method for forming thin film at low temperature and high deposition rate'20035,231,289'Thermal photodetector and method of manufacturing the same'1993Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1993–2020Patents assigned to SHIMADZU CORP (18)· patent assignee history
1993–2020Based in Kyoto, JP· patent location history
2013–2018Patents assigned to KISHIHARA HIROYUKI (5)· patent assignee history
2013–2018Patents assigned to KAINO MASATOMO (4)· patent assignee history
2013–2018Patents assigned to TANABE KOICHI (4)· patent assignee history
2013–2018Patents assigned to TOKUDA SATOSHI (4)· patent assignee history
2013–2019Based in Kizugawa-shi, JP· patent location history
2019Based in Soraku-gun, JP· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| SHIMADZU CORP | 18 | 1993–2020 |
| KISHIHARA HIROYUKIself | 5 | 2013–2018 |
| KAINO MASATOMO | 4 | 2013–2018 |
| TANABE KOICHI | 4 | 2013–2018 |
| TOKUDA SATOSHI | 4 | 2013–2018 |
Locations
| Location | Patents | Span |
|---|---|---|
| Kyoto, JP | 12 | 1993–2020 |
| Kizugawa-shi, JP | 8 | 2013–2019 |
| Soraku-gun, JP | 1 | 2019 |