Inventor
Valentin Rosskopf
Inventor
Pöttmes, DE
Overview
Patents· 12 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
H10Pprimary
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1038%
G11CStatic stores23%
H10BElectronic memory devices23%
H10DInorganic electric semiconductor devices12%
Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests4%
PatentTitleYear
7,372,072'Semiconductor wafer with test structure'20087,205,567'Semiconductor product having a semiconductor substrate and a test structure and method'20076,930,324'Device architecture and process for improved vertical memory arrays'20056,930,325'Test structure for improved vertical memory arrays'20056,897,077'Test structure for determining a short circuit between trench capacitors in a memory cell array'20056,878,965'Test structure for determining a region of a deep trench outdiffusion in a memory cell array'20056,856,562'Test structure for measuring a junction resistance in a DRAM memory cell array'20056,853,000'Test structure for determining a doping region of an electrode connection between a trench capacitor and a selection transistor in a memory cell array'20056,838,724'Transistor array and semiconductor memory configuration fabricated with the transistor array'20056,656,647'Method for examining structures on a wafer'20036,529,031'Integrated circuit configuration for testing transistors, and a semiconductor wafer having such a circuit configuration'20036,484,307'Method for fabricating and checking structures of electronic circuits in a semiconductor substrate'2002Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2002–2008Patents assigned to INFINEON TECHNOLOGIES AG (12)· patent assignee history
2002–2008Based in Poettmes-Schorn, DE· patent location history
2003–2005Based in Poettmes, DE· patent location history
2005Based in Pöttmes, DE· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| INFINEON TECHNOLOGIES AG | 12 | 2002–2008 |
Locations
| Location | Patents | Span |
|---|---|---|
| Pöttmes, DE | 5 | 2005 |
| Poettmes, DE | 4 | 2003–2005 |
| Poettmes-Schorn, DE | 3 | 2002–2008 |