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Inventor

Hiroshi Noda

Inventor
Tokyo, JP

Overview

49→
Patents
1977–2020
Patent span
Physics
Primary field (CPC G)

Patents· 49 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Rprimary
G01RMeasuring electric variables10%
G06FElectric digital data processing9%
B41JTypewriters8%
H03KPulse technique8%
G03BApparatus or arrangements for taking photographs or for projecting or viewing them7%
G05BControl or regulating systems in general6%
H04NPictorial communication, e.g. television6%
A21CMachines or equipment for making or processing doughs5%
G01SRadio direction-finding3%
G02BOptical elements, systems or apparatus3%
PatentTitleYear
10,849,328Bread conveying apparatus202010,855,924Electronic device, control method thereof, and storage medium for setting exposure control parameter20209,993,462Hydantoin derivative-containing pharmaceutical composition20189,776,220'Cylinder head cleaning method and cylinder head cleaning device'20179,532,574'Kneaded dough dividing apparatus'20179,238,372'Image forming apparatus'20169,126,795'Image forming apparatus'20159,079,224'Cylinder head cleaning method and cylinder head cleaning device'20159,039,137'Image forming apparatus'20158,939,558'Image forming apparatus including liquid ejection head'20158,836,849'Imaging apparatus, control method for imaging apparatus, and program'20148,831,417'Image pickup apparatus and lens apparatus having mechanical and electronic shutters where blur correction is adjusted according to shutter mode'20148,727,494'Droplet ejection device and image forming apparatus'20148,672,446'Image forming apparatus including recording head for ejecting liquid droplets'20148,596,551'Humidity control system'20138,464,042'Performance adjustment apparatus and method of information processing apparatus'20138,342,152'Flow controlling method for an auxiliary intake flow passage'20138,259,595'Method and system for diagnosing external signal input/output units'20128,224,168'Image pickup apparatus and lens apparatus having mechanical and electronic shutters where blur correction is adjusted according to shutter mode'20127,962,781'Control method for information storage apparatus, information storage apparatus and computer readable information recording medium'20117,957,638'Image pickup apparatus and method of controlling the same'20117,831,743'Numerical controller managing multiple input/output units that automatically allocate and stores group IDs for the input/output units'20107,794,034'Image formation apparatus'20107,560,949'Manufacturing method of semiconductor device and semiconductor device corresponding to loop back test'20097,283,163'Image processing apparatus providing noise correction'20077,178,893'Head controller, inkjet recording apparatus, and image recording apparatus that prevent degradation in image quality due to environmental temperature changes'20077,038,418'Numerical control apparatus'20066,733,268'Dividing apparatus'20046,616,439'Rounding apparatus'20036,529,024'Probe stylus'20036,476,598'Ringing preventive circuit, device under test board, pin electronics card, and semiconductor device'20026,404,213'Probe stylus'2002D0457210'Golf club head'20026,335,616'Ringing preventive circuit, device under test board, pin electronics card, and semiconductor device'20026,285,915'Numerical control device, and screen display and data input and output method for numerical control device'20016,191,573'Ringing preventive circuit, device under test board, pin electronics card, and semiconductor device'20016,066,946'Semiconductor device having ringing preventive circuit for removing noise from an output source'20006,011,500'Integrated circuit with a built-in D/A converter'20005,945,823'Pin electronics card having ringing preventive circuit for removing noise in an electronics transmission path of a semiconductor testing apparatus'19995,894,172'Semiconductor device with identification function'19995,870,042'Method of and apparatus for testing A-D converter with a source current measurement and reduced external test terminals'19995,736,851'Ringing preventive circuit for removing noise in an electronics transmission on path of semiconductor testing apparatus'19985,675,523'Waveform data generating apparatus'1997D0380513'Golf club head'19975,396,211'Miniature transformer having compressed laminations'19955,155,688'Vehicle navigation system'19924,748,682'Combined diversity receiving apparatus'19884,078,235'Obstacle detecting system'19784,005,422'Radar with sampling gate circuit for video signal'1977

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1977–2003Patents assigned to MITSUBISHI ELECTRIC CORP (16)· patent assignee history
1997–2016Patents assigned to NODA HIROSHI (15)· patent assignee history
1998–2020Based in Tokyo, JP· patent location history
2001–2012Patents assigned to FANUC LTD (4)· patent assignee history
2001–2012Based in Yamanashi, JP· patent location history
2003–2017Based in Kanagawa, JP· patent location history
2007–2020Patents assigned to CANON KK (6)· patent assignee history
2011–2013Based in Kawasaki, JP· patent location history
2014–2016Patents assigned to RICOH CO LTD (6)· patent assignee history
2015–2017Based in Toyota, JP· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
MITSUBISHI ELECTRIC CORP161977–2003
NODA HIROSHIself151997–2016
CANON KK62007–2020
RICOH CO LTD62014–2016
FANUC LTD42001–2012
Locations
LocationPatentsSpan
Tokyo, JP171998–2020
Kanagawa, JP112003–2017
Yamanashi, JP42001–2012
Toyota, JP22015–2017
Kawasaki, JP22011–2013