Inventor

Joseph Daniel Tobiason

Inventor
Woodinville, WA, US

Overview

52→
Patents
2005–2021
Patent span
Physics
Primary field (CPC G)

Patents· 52 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Dprimary
G01DMeasuring not specially adapted for a specific variable42%
G01BMeasuring length, thickness or similar linear dimensions25%
G02BOptical elements, systems or apparatus8%
H04NPictorial communication, e.g. television6%
G01SRadio direction-finding4%
G06TImage data processing or generation, in general4%
F21VFunctional features or details of lighting devices or systems thereof1%
G01JMeasurement of intensity, velocity, spectral content, polarisation, phase or pulse characteristics of infrared, visible or ultraviolet light1%
G01LMeasuring force, stress, torque, work, mechanical power, mechanical efficiency, or fluid pressure1%
G01NInvestigating or analysing materials by determining their chemical or physical properties1%
PatentTitleYear
11,119,214Triangulation sensing system and method with triangulation light extended focus range using variable focus lens202111,112,541Tunable acoustic gradient lens system with reflective configuration and increased power202110,809,378Triangulation sensing system and method with triangulation light extended focus range using variable focus lens202010,648,838Contamination and defect resistant rotary optical encoder configuration including a rotary scale with yawed scale grating bars and structured illumination generating arrangement with a beam deflector configuration202010,593,718Surface profiling and imaging system including optical channels providing distance-dependent image offsets202010,520,301Method for measuring Z height values of a workpiece surface with a machine vision inspection system201910,352,679Compact coordinate measurement machine configuration with large working volume relative to size201910,302,466Contamination and defect resistant optical encoder configuration including first and second illumination source diffraction gratings arranged in first and second parallel planes for providing displacement signals201910,295,648Contamination and defect resistant optical encoder configuration including a normal of readhead plane at a non-zero pitch angle relative to measuring axis for providing displacement signals201910,295,378Contamination and defect resistant optical encoder configuration outputting structured illumination to a scale plane for providing displacement signals201910,274,344Displacement encoder201910,168,189Contamination and defect resistant optical encoder configuration for providing displacement signal having a plurality of spatial phase detectors arranged in a spatial phase sequence along a direction transverse to the measuring axis201910,094,685Displacement encoder20189,080,899'Optical displacement encoder having plural scale grating portions with spatial phase offset of scale pitch'20159,029,757'Illumination portion for an adaptable resolution optical encoder'20159,018,578'Adaptable resolution optical encoder having structured illumination and spatial filtering'20158,941,052'Illumination portion for an adaptable resolution optical encoder'20158,898,923'System and method for setting measurement force thresholds in a force sensing caliper'20148,772,706'Multiple wavelength configuration for an optical encoder readhead including dual optical path region with an optical path length difference'20148,692,880'Image correlation displacement sensor'20148,604,413'Optical encoder including displacement sensing normal to the encoder scale grating surface'20138,605,291'Image correlation displacement sensor'20138,492,703'Lens aberration correction in a doubly telecentric displacement sensor'20138,179,534'Fixed wavelength absolute distance interferometer'20128,085,295'Controllable micro light assembly'20118,045,002'Systems and methods for controlling strobe illumination'20117,973,941'Reference signal generating configuration for an interferometric miniature grating encoder readhead using fiber optic receiver channels'20117,965,393'Reference signal generating configuration for an interferometric miniature grating encoder readhead using fiber optic receiver channels'20117,656,425'Robust field of view distortion calibration'20107,608,813'Scale track configuration for absolute optical encoder including a detector electronics with plurality of track detector portions'20097,570,433'Photoelectric encoder'20097,502,122'Fiber-optic miniature encoder for fine pitch scales'20097,432,496'Encoder scale writing or calibration at an end-use installation based on correlation sensing'20087,433,052'Systems and methods for tilt and range measurement'20087,433,128'Adaptive light-path surface tilt sensor for machine vision inspection'20087,400,414'Hand-size structured-light three-dimensional metrology imaging system and method'20087,307,736'Scale for use with a translation and orientation sensing system'20077,295,324'System and method for improving accuracy in a speckle-based image correlation displacement sensor'20077,292,347'Dual laser high precision interferometer'20077,217,041'Fiber-optic alignment with detector IC'20077,211,782'Precision measuring gauges with optical fiber output channels'20077,186,969'Optical configuration for imaging-type optical encoders'20077,130,320'External cavity laser with rotary tuning element'20067,126,696'Interferometric miniature grating encoder readhead using fiber optic receiver channels'20067,091,475'Miniature 2-dimensional encoder readhead using fiber optic receiver channels'20067,088,441'Method and apparatus for measuring wavelength changes in a high-resolution measurement system'20067,075,097'Optical path array and angular filter for translation and orientation sensing'20067,053,362'Absolute position miniature grating encoder readhead using fiber optic receiver channels'20066,905,258'Miniature imaging encoder readhead using fiber optic receiver channels'20056,906,315'High accuracy miniature grating encoder readhead using fiber optic receiver channels'20056,850,329'Interferometer using integrated imaging array and high-density polarizer array'20056,847,457'Interferometer using integrated imaging array and high-density phase-shifting array'2005

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

2005–2021Patents assigned to MITUTOYO CORP (52)· patent assignee history
2005–2019Based in Woodinville, WA, US· patent location history
2005Based in Woddinville, WA, US· patent location history
2011–2014Patents assigned to TOBIASON JOSEPH D (3)· patent assignee history
2011Patents assigned to GLADNICK PAUL G (1)· patent assignee history
2012–2014Patents assigned to TOBIASON JOSEPH DANIEL (4)· patent assignee history
2013Patents assigned to ALTENDORF ERIC H (1)· patent assignee history
2014–2021Based in Bothell, WA, US· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
MITUTOYO CORP522005–2021
TOBIASON JOSEPH DANIELself42012–2014
TOBIASON JOSEPH Dself32011–2014
ALTENDORF ERIC H12013
GLADNICK PAUL G12011
Locations
LocationPatentsSpan
Woodinville, Washington, US362005–2019
Bothell, Washington, US152014–2021
Woddinville, Washington, US12005