Inventor
David K. McElfresh
Inventor
San Diego, CA, US
Overview
Patents· 55 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Rprimary
G01RMeasuring electric variables17%
G06FElectric digital data processing17%
B41JTypewriters14%
G01MTesting static or dynamic balance of machines or structures6%
G11BInformation storage based on relative movement between record carrier and transducer6%
G01HMeasurement of mechanical vibrations or ultrasonic, sonic or infrasonic waves5%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h105%
G01NInvestigating or analysing materials by determining their chemical or physical properties4%
G01BMeasuring length, thickness or similar linear dimensions3%
G01PMeasuring linear or angular speed, acceleration, deceleration, or shock3%
PatentTitleYear
10,591,383Characterizing the I/O-performance-per-watt of a computing device across a range of vibrational operating environments20209,557,301'Methods for characterizing vibration of a rack structure'20179,229,045'In-situ characterization of a solid-state light source'20168,843,330'Characterizing the response of a computer system component to vibrations'20148,798,944'Estimating ball-grid-array longevity in a computer system'20148,666,912'Mechanical shock feature extraction for overstress event registration'20148,635,048'Methods for characterizing vibration of a rack structure'20148,601,212'Scheduling read operations during drive reconstruction in an array of redundant disk drives'20138,543,346'Near-isotropic antenna for monitoring electromagnetic signals'20138,489,343'Detecting constrained motion of a component in a computer system'20138,340,923'Predicting remaining useful life for a computer system using a stress-based prediction technique'20128,306,311'Method and system for automated ball-grid array void quantification'20128,275,738'Radio frequency microscope for amplifying and analyzing electromagnetic signals by positioning the monitored system at a locus of an ellipsoidal surface'20128,239,623'Scheduling read operations during drive reconstruction in an array of redundant disk drives'20128,213,281'Characterizing the performance of a disk drive across a range of vibration frequencies'20128,207,752'Fault-tolerant multi-chip module'20128,204,716'System and method for characterizing vibration of a rack structure'20128,190,276'Method and apparatus for controlling temperature variations in a computer system'20128,140,282'Determining a total length for conductive whiskers in computer systems'20128,140,277'Enhanced characterization of electrical connection degradation'20128,055,594'Proactive detection of metal whiskers in computer systems'20117,982,468'Apparatus and method for testing electrical interconnects with switches'20117,920,974'Generating a vibration profile for a rotating cooling device in a computer system'20117,920,986'Surface shape metric and method to quantify the surface shape of electronic packages'20117,890,278'Characterizing the response of a device in a computer system to vibration over a frequency range'20117,869,905'Method and apparatus for using a heater to control the temperature of a power supply in a computer system'20117,870,440'Method and apparatus for detecting multiple anomalies in a cluster of components'20117,861,593'Rotational vibration measurements in computer systems'20117,832,818'Inkjet pen with proximity interconnect'20107,813,119'Method and apparatus for reducing coupled hard disk drive vibration'20107,800,385'Apparatus and method for testing electrical interconnects'20107,680,624'Method and apparatus for performing a real-time root-cause analysis by analyzing degrading telemetry signals'20107,672,808'Determining a center of rotation for a component in a computer system'20107,668,696'Method and apparatus for monitoring the health of a computer system'20107,577,542'Method and apparatus for dynamically adjusting the resolution of telemetry signals'20097,466,404'Technique for diagnosing and screening optical interconnect light sources'20087,353,431'Method and apparatus for proactive fault monitoring in interconnects'20087,330,325'Proactive fault monitoring of disk drives through phase-sensitive surveillance'20087,323,363'Contact load profile modification for a compression socketed CPU'20087,283,919'Determining the quality and reliability of a component by monitoring dynamic variables'20077,216,062'Characterizing degradation of components during reliability-evaluation studies'20077,184,932'Reliability prediction for complex components'20077,162,393'Detecting degradation of components during reliability-evaluation studies'20076,997,540'Substrate for fluid ejection devices'20066,930,488'Method and apparatus for accelerated SER testing of circuitry'20056,886,905'Inkjet printing with air movement system'20056,880,246'Method of forming substrate with fluid passage supports'20056,843,552'Electrical circuit for printhead assembly'20056,719,398'Inkjet printing with air movement system'20046,705,705'Substrate for fluid ejection devices'20046,575,559'Joining of different materials of carrier for fluid ejection devices'20036,557,976'Electrical circuit for wide-array inkjet printhead assembly'20036,520,624'Substrate with fluid passage supports'20036,409,307'Coplanar mounting of printhead dies for wide-array inkjet printhead assembly'20025,514,627'Method and apparatus for improving the performance of light emitting diodes'1996Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1996Based in Union City, CA, US· patent location history
2002–2020Based in San Diego, CA, US· patent location history
2005–2010Patents assigned to SUN MICROSYSTEMS INC (13)· patent assignee history
2010–2017Patents assigned to ORACLE AMERICA INC (26)· patent assignee history
2012–2016Patents assigned to MCELFRESH DAVID K (18)· patent assignee history
2012–2016Patents assigned to GROSS KENNY C (11)· patent assignee history
2012–2014Patents assigned to BOUGAEV ANTON A (10)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| ORACLE AMERICA INC | 26 | 2010–2017 |
| MCELFRESH DAVID Kself | 18 | 2012–2016 |
| SUN MICROSYSTEMS INC | 13 | 2005–2010 |
| GROSS KENNY C | 11 | 2012–2016 |
| BOUGAEV ANTON A | 10 | 2012–2014 |
Locations
| Location | Patents | Span |
|---|---|---|
| San Diego, California, US | 54 | 2002–2020 |
| Union City, California, US | 1 | 1996 |