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Inventor

Masato Hara

Inventor
Tokyo, JP

Overview

45→
Patents
1984–2013
Patent span
Physics
Primary field (CPC G)

Patents· 45 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Mprimary
G01MTesting static or dynamic balance of machines or structures29%
G01CMeasuring distances, levels or bearings12%
G01DMeasuring not specially adapted for a specific variable6%
G02BOptical elements, systems or apparatus6%
A61BDiagnosis5%
G01NInvestigating or analysing materials by determining their chemical or physical properties5%
G03BApparatus or arrangements for taking photographs or for projecting or viewing them5%
G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices5%
H03KPulse technique5%
H04NPictorial communication, e.g. television3%
PatentTitleYear
8,415,989'Switching device for electric circuit'20137,859,138'Drive circuit'20106,853,441'Projection aligner'20056,839,124'Projection aligner'20056,807,013'Projection aligner'20046,804,386'Optical member inspecting apparatus and method of inspection thereof'20046,788,804'Optical member inspecting apparatus and method of inspection thereof'20046,727,979'Projection aligner'20046,717,683'Target for photogrammetric analytical measurement system'20046,697,513'Optical member inspecting apparatus and method of inspection thereof'20046,636,625'Optical member inspecting apparatus and method of inspection thereof'20036,628,803'Device for calculating positional data of standard points of photogrammetric target'20036,535,627'Optical member inspecting apparatus and method of inspection thereof'20036,477,264'Optical member inspecting apparatus and method of inspection thereof'20026,476,909'Optical member inspecting apparatus and method of inspection thereof'20026,434,263'Optical member inspecting apparatus and method of inspection thereof'20026,430,310'Optical member inspecting apparatus and method of inspection thereof'20026,427,023'Optical member inspecting apparatus and method of inspection thereof'20026,363,165'Optical member inspecting apparatus and method of inspection thereof'20026,351,554'Optical member inspecting apparatus and method of inspection thereof'20026,349,145'Optical member inspecting apparatus and method of inspection thereof'20026,314,200'Optical member inspecting apparatus and method of inspection thereof'20016,304,669'Photogrammetric analytical measurement system'20016,208,475'Optical-member inspection apparatus and holder for inspection target member'20016,148,097'Optical member inspecting apparatus and method of inspection thereof'20005,991,102'Beam protecting device'19995,978,148'Beam projecting device'19995,847,822'Optical element inspecting apparatus'19985,838,431'Laser marking device'19985,835,207'Optical member inspecting apparatus'19985,828,500'Optical element inspecting apparatus'19985,675,422'Facsimile apparatus'19975,315,403'Facsimile apparatus in which input to memory is controlled based upon capacity of external storage device'19945,026,978'Photoelectric switch having pulse driver circuitry'19914,990,768'Electronic apparatus including photoelectric switch'19914,883,955'Optical encoder with converging means'19894,702,008'Zero setting device in surveying instrument'19874,700,063'Encoder output error detecting circuit'19874,678,910'Reference position-detecting device for photoelectric encoder'19874,633,419'Angle measuring device'19864,626,682'Angle measuring device'19864,620,092'Elevation angle measuring device with apparatus for disabling the device when its inclination angle is offset from a predetermined inclination angle'19864,543,477'Safety device for detecting trouble in optical transmission fibers'19854,540,253'Method and device for measuring eye refraction errors'19854,486,080'Device for detecting blinking of an eye under examination'1984

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1984–2004Patents assigned to ASAHI OPTICAL CO LTD (32)· patent assignee history
1984–2005Based in Tokyo, JP· patent location history
1991Patents assigned to OMRON TATEISI ELECTRONICS CO (2)· patent assignee history
1991Based in Kyoto, JP· patent location history
1994–1997Patents assigned to CANON KK (2)· patent assignee history
1994–1997Based in Yokohama, JP· patent location history
2003–2005Patents assigned to PENTAX CORP (6)· patent assignee history
2005Based in Toyko, JP· patent location history
2010–2013Patents assigned to SANKEN ELECTRIC CO LTD (2)· patent assignee history
2010–2013Based in Niiza, JP· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
ASAHI OPTICAL CO LTD321984–2004
PENTAX CORP62003–2005
CANON KK21994–1997
OMRON TATEISI ELECTRONICS CO21991
SANKEN ELECTRIC CO LTD22010–2013
Locations
LocationPatentsSpan
Tokyo, JP381984–2005
Niiza, JP22010–2013
Yokohama, JP21994–1997
Kyoto, JP21991
Toyko, JP12005