Inventor
James Moyne
Inventor
Canton, MI, US
Overview
Patents· 18 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G05Bprimary
G05BControl or regulating systems in general29%
Y02PClimate change mitigation technologies in the production or processing of goods18%
G06QInformation and communication technology [ict] specially adapted for administrative, commercial, financial, managerial or supervisory purposes15%
G06NComputing arrangements based on specific computational models11%
C23CCoating metallic material4%
F27BFurnaces, kilns, ovens or retorts in general4%
G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices4%
G06FElectric digital data processing4%
H01LSemiconductor devices4%
H05KPrinted circuits4%
PatentTitleYear
11,126,172Methods and systems for applying run-to-run control and virtual metrology to reduce equipment recovery time202111,022,968Methods and systems for applying run-to-run control and virtual metrology to reduce equipment recovery time202110,884,400Matching process controllers for improved matching of process202110,620,620Method and apparatus for determining when to perform or trigger events in semi-conductor processing equipment202010,409,231Methods and apparatuses for utilizing adaptive predictive algorithms and determining when to use the adaptive predictive algorithms for virtual metrology201910,042,357Portable, adaptable equipment health user interface20189,886,009'Methods and apparatuses for utilizing adaptive predictive algorithms and determining when to use the adaptive predictive algorithms for virtual metrology'20189,606,519'Matching process controllers for improved matching of process'20179,582,828'Method and apparatus for optimizing profit in predictive systems'20179,275,334'Increasing signal to noise ratio for creation of generalized and robust prediction models'20169,002,492'Methods and apparatuses for utilizing adaptive predictive algorithms and determining when to use the adaptive predictive algorithms for virtual metrology'20158,774,956'Yield prediction feedback for controlling an equipment engineering system'20148,620,468'Method and apparatus for developing, improving and verifying virtual metrology models in a manufacturing system'20138,612,864'User interface with visualization of real and virtual data'20138,612,043'Yield prediction feedback for controlling an equipment engineering system'20137,979,380'Dynamically updated predictive model'20117,974,723'Yield prediction feedback for controlling an equipment engineering system'20115,469,361'Generic cell controlling method and apparatus for computer integrated manufacturing system'1995Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1995Patents assigned to UNIV MICHIGAN (1)· patent assignee history
1995Based in Ypsilanti, MI, US· patent location history
2011–2021Patents assigned to APPLIED MATERIALS INC (17)· patent assignee history
2011–2021Based in Canton, MI, US· patent location history
2013–2018Patents assigned to MOYNE JAMES (6)· patent assignee history
2013–2014Patents assigned to STAFFORD RICHARD (3)· patent assignee history
2013–2014Patents assigned to WARD NICHOLAS (2)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| APPLIED MATERIALS INC | 17 | 2011–2021 |
| MOYNE JAMESself | 6 | 2013–2018 |
| STAFFORD RICHARD | 3 | 2013–2014 |
| WARD NICHOLAS | 2 | 2013–2014 |
| UNIV MICHIGAN | 1 | 1995 |
Locations
| Location | Patents | Span |
|---|---|---|
| Canton, MI, US | 17 | 2011–2021 |
| Ypsilanti, MI, US | 1 | 1995 |