Inventor
Kazushi Yoshimura
Inventor
Kamakura, JP
Overview
Patents· 14 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Rprimary
G01RMeasuring electric variables26%
H01JElectric discharge tubes or discharge lamps26%
G01NInvestigating or analysing materials by determining their chemical or physical properties11%
G06TImage data processing or generation, in general11%
G02FOptical devices or arrangements for the control of light by modification of the optical properties of the media of the elements involved therein7%
B23KSoldering or unsoldering4%
G01BMeasuring length, thickness or similar linear dimensions4%
G06VImage or video recognition or understanding4%
H10DInorganic electric semiconductor devices4%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h104%
PatentTitleYear
9,134,279'Internal defect inspection method and apparatus for the same'20158,035,058'Apparatus for repairing circuit pattern and method for manufacturing display apparatus using the same'20117,952,074'Method and apparatus for inspecting integrated circuit pattern'20117,417,444'Method and apparatus for inspecting integrated circuit pattern'20087,026,830'Method and apparatus for inspecting integrated circuit pattern'20066,831,998'Inspection system for circuit patterns and a method thereof'20046,559,663'Method and apparatus for inspecting integrated circuit pattern'20036,329,826'Method and apparatus for inspecting integrated circuit pattern'20016,172,363'Method and apparatus for inspecting integrated circuit pattern'20015,883,437'Method and apparatus for inspection and correction of wiring of electronic circuit and for manufacture thereof'19995,781,294'Method and apparatus for detecting photoacoustic signal to detect surface and subsurface information of the specimen'19985,301,248'Method for pattern inspection and apparatus therefor'19944,772,125'Apparatus and method for inspecting soldered portions'19884,556,797'Method and apparatus for detecting edge of fine pattern on specimen'1985Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1985–2015Patents assigned to HITACHI LTD (13)· patent assignee history
1985–1994Based in Yokohama, JP· patent location history
1998–2015Based in Kamakura, JP· patent location history
2011Patents assigned to HITACHI DISPLAYS LTD (1)· patent assignee history
2015Patents assigned to MATSUI TETSUYA (1)· patent assignee history
2015Patents assigned to NAKATA TOSHIHIKO (1)· patent assignee history
2015Patents assigned to TACHIZAKI TAKEHIRO (1)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| HITACHI LTD | 13 | 1985–2015 |
| HITACHI DISPLAYS LTD | 1 | 2011 |
| MATSUI TETSUYA | 1 | 2015 |
| NAKATA TOSHIHIKO | 1 | 2015 |
| TACHIZAKI TAKEHIRO | 1 | 2015 |
Locations
| Location | Patents | Span |
|---|---|---|
| Kamakura, JP | 11 | 1998–2015 |
| Yokohama, JP | 3 | 1985–1994 |