Inventor

David Trussell

Inventor
Fremont, CA, US

Overview

17→
Patents
1999–2021
Patent span
Electricity
Primary field (CPC H)

Patents· 17 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

H01Jprimary
H01JElectric discharge tubes or discharge lamps22%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1022%
C23CCoating metallic material16%
H01LSemiconductor devices16%
Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests8%
G01JMeasurement of intensity, velocity, spectral content, polarisation, phase or pulse characteristics of infrared, visible or ultraviolet light4%
H05HPlasma technique4%
B08BCleaning in general2%
G05BControl or regulating systems in general2%
H01QAntennas, i.e. radio aerials2%
PatentTitleYear
11,112,773Systems for removing and replacing consumable parts from a semiconductor process module in situ202110,804,079Active showerhead202010,790,174Wafer transport assembly with integrated buffers202010,403,476Active showerhead201910,304,707Load lock interface and integrated post-processing module201910,014,196Wafer transport assembly with integrated buffers20189,929,028'Service tunnel for use on capital equipment in semiconductor manufacturing and research fabs'20189,502,275'Service tunnel for use on capital equipment in semiconductor manufacturing and research fabs'20168,573,153'Multi-part electrode for a semiconductor processing plasma reactor and method of replacing a portion of a multi-part electrode'20138,500,952'Plasma confinement rings having reduced polymer deposition characteristics'20138,262,922'Plasma confinement rings having reduced polymer deposition characteristics'20127,861,667'Multi-part electrode for a semiconductor processing plasma reactor and method of replacing a portion of a multi-part electrode'20117,430,986'Plasma confinement ring assemblies having reduced polymer deposition characteristics'20087,169,256'Plasma processor with electrode responsive to multiple RF frequencies'2007RE038097'Chemical vapor deposition system with a plasma chamber having separate process gas and cleaning gas injection ports'20035,988,187'Chemical vapor deposition system with a plasma chamber having separate process gas and cleaning gas injection ports'19995,911,833'Method of in-situ cleaning of a chuck within a plasma chamber'1999

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1999–2021Patents assigned to LAM RES CORP (17)· patent assignee history
1999–2021Based in Fremont, CA, US· patent location history
2012–2013Patents assigned to TRUSSELL DAVID (3)· patent assignee history
2012–2013Patents assigned to DHINDSA RAJINDER (2)· patent assignee history
2012–2013Patents assigned to KOZAKEVICH FELIX (2)· patent assignee history
2012–2013Patents assigned to ROGERS JAMES H (2)· patent assignee history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
LAM RES CORP171999–2021
TRUSSELL DAVIDself32012–2013
DHINDSA RAJINDER22012–2013
KOZAKEVICH FELIX22012–2013
ROGERS JAMES H22012–2013
Locations
LocationPatentsSpan
Fremont, California, US171999–2021