Inventor
Lee Grodzins
Inventor
Lexington, MA, US
Overview
Patents· 64 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties42%
G01VGeophysics19%
G21KHandling of particles or ionising radiation not otherwise provided for13%
G01TMeasurement of nuclear or x-radiation9%
H01JElectric discharge tubes or discharge lamps4%
A61BDiagnosis3%
H01LSemiconductor devices2%
H10FInorganic semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation2%
G02BOptical elements, systems or apparatus2%
G01BMeasuring length, thickness or similar linear dimensions1%
PatentTitleYear
10,656,304Backscatter characterization using interlinearly adaptive electromagnetic X-ray scanning202010,209,372Hand-held X-ray detection system using wavelength-shifting fiber-coupled scintillation detectors20199,841,386'Radiation threat detection'20179,658,343'Spectral discrimination using wavelength-shifting fiber-coupled scintillation detectors'20179,291,582'Adjustable-jaw collimator'20169,285,488'X-ray inspection using wavelength-shifting fiber-coupled scintillation detectors'20169,052,271'Versatile x-ray beam scanner'20159,020,103'Versatile beam scanner with fan beam'20159,014,339'Versatile x-ray beam scanner'20158,693,625'Dynamic shaping time modification in X-ray detectors'20148,494,113'Automated sum-peak suppression in an X-ray fluorescence analyzer'20138,436,315'Compact thermal neutron monitor'20138,433,034'Localization of an element of interest by XRF analysis of different inspection volumes'20138,325,871'Radiation threat detection'20128,229,064'Localization of an element of interest by XRF analysis of different inspection volumes'20128,155,268'Rapid screening for lead concentration compliance by X-ray fluorescence (XRF) analysis'20127,933,379'Measurement of lead by X-ray fluorescence'20117,916,834'Small spot X-ray fluorescence (XRF) analyzer'20117,899,153'Automated x-ray fluorescence analysis'20117,821,634'Laser-triggered plasma apparatus for atomic emission spectroscopy'20107,787,589'In vivo measurement of trace elements in bone by x-ray fluorescence'20107,702,067'Measurement of lead by X-ray fluorescence'20107,671,350'Portable X-ray fluorescence instrument with tapered absorption collar'20107,634,052'Two-stage x-ray concentrator'20097,525,101'Neutron and gamma ray monitor'20097,391,508'Arc/spark optical emission spectroscopy correlated with spark location'20087,375,359'Portable X-ray fluorescence instrument with tapered absorption collar'20087,375,358'Radiation shield for portable x-ray fluorescence instruments'20087,302,034'Analysis of elemental composition and thickness in multilayered materials'20077,218,704'X-ray backscatter mobile inspection van'20077,099,434'X-ray backscatter mobile inspection van'20067,010,094'X-ray inspection using spatially and spectrally tailored beams'20066,965,118'Radiation shield for portable x-ray fluorescence instruments'20056,801,595'X-ray fluorescence combined with laser induced photon spectroscopy'20046,765,986'X-ray fluorescence analyzer'20046,621,888'X-ray inspection by coherent-scattering from variably disposed scatterers identified as suspect objects'20036,542,574'System for inspecting the contents of a container'2003RE037899'Tomographic method of x-ray imaging'20026,459,764'Drive-through vehicle inspection system'20026,459,761'Spectrally shaped x-ray inspection system'20026,453,007'X-ray inspection using co-planar pencil and fan beams'20026,442,233'Coherent x-ray scatter inspection system with sidescatter and energy-resolved detection'20026,434,219'Chopper wheel with two axes of rotation'20026,424,695'Separate lateral processing of backscatter signals'20026,421,420'Method and apparatus for generating sequential beams of penetrating radiation'20026,356,620'Method for raster scanning an X-ray tube focal spot'20026,320,933'Multiple scatter system for threat identification'20016,282,260'Unilateral hand-held x-ray inspection apparatus'20016,249,567'X-ray back scatter imaging system for undercarriage inspection'20016,192,101'X-ray determination of the mass distribution in containers'20016,192,104'Fan and pencil beams from a common source for x-ray inspection'20016,151,381'Gated transmission and scatter detection for x-ray imaging'20006,081,580'Tomographic inspection system'20006,067,344'X-ray ambient level safety system'20005,930,326'Side scatter tomography system'19995,910,973'Rapid X-ray inspection system'19995,696,806'Tomographic method of x-ray imaging'19975,461,654'X-ray fluorescence detector'19955,396,529'X-ray fluorescence detector'19955,390,229'Lead-paint detector'19955,274,688'Lead-paint detector'19935,251,240'Method and apparatus for employing resonance-produced gamma rays to detect the presence of both nitrogen and oxygen in objects that may contain explosives'19934,920,270'Radon detection'19904,804,852'Treating work pieces with electro-magnetically scanned ion beams'1989Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1989–2020Based in Lexington, MA, US· patent location history
1990–2016Patents assigned to GRODZINS LEE (12)· patent assignee history
1999–2020Patents assigned to AMERICAN SCIENCE & ENG INC (33)· patent assignee history
2007–2012Patents assigned to THERMO NITON ANALYZERS LLC (13)· patent assignee history
2012–2014Patents assigned to THERMO SCIENT PORTABLE ANALYTICAL INSTR INC (5)· patent assignee history
2015–2016Patents assigned to AL-KOFAHI OMAR (3)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| AMERICAN SCIENCE & ENG INC | 33 | 1999–2020 |
| THERMO NITON ANALYZERS LLC | 13 | 2007–2012 |
| GRODZINS LEEself | 12 | 1990–2016 |
| THERMO SCIENT PORTABLE ANALYTICAL INSTR INC | 5 | 2012–2014 |
| AL-KOFAHI OMAR | 3 | 2015–2016 |
Locations
| Location | Patents | Span |
|---|---|---|
| Lexington, Massachusetts, US | 64 | 1989–2020 |