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Inventor

Toshiyuki Nakao

Inventor
Yokohama, JP

Overview

41→
Patents
1979–2019
Patent span
Physics
Primary field (CPC G)

Patents· 41 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties49%
F16HGearing8%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h108%
G01BMeasuring length, thickness or similar linear dimensions6%
G06FElectric digital data processing5%
H01LSemiconductor devices5%
Y10TTechnical subjects covered by former us classification5%
B60KArrangement or mounting of propulsion units or of transmissions in vehicles3%
G11CStatic stores3%
B60WConjoint control of vehicle sub-units of different type or different function2%
PatentTitleYear
10,352,879X-ray inspection method and device201910,254,235Defect inspecting method and defect inspecting apparatus20199,841,384'Defect inspecting method and defect inspecting apparatus'20179,506,872'Inspection apparatus'20169,228,960'Defect inspecting method and defect inspecting apparatus'20169,041,921'Defect inspection device and defect inspection method'20158,958,062'Defect inspection method and device using same'20158,934,092'Surface defect inspection method and apparatus'20158,804,110'Fault inspection device and fault inspection method'20148,711,347'Defect inspection method and device therefor'20148,705,026'Inspection apparatus'20148,670,116'Method and device for inspecting for defects'20148,654,350'Inspecting method and inspecting apparatus for substrate surface'20148,638,429'Defect inspecting method and defect inspecting apparatus'20148,599,369'Defect inspection device and inspection method'20138,514,388'Flaw inspecting method and device therefor'20138,482,727'Defect inspection method'20138,477,302'Defect inspection apparatus'20138,400,629'Surface defect inspection method and apparatus'20138,314,929'Method and its apparatus for inspecting defects'20128,310,665'Inspecting method and inspecting apparatus for substrate surface'20128,264,679'Inspection apparatus'20128,144,337'Inspecting method and inspecting apparatus for substrate surface'20128,120,766'Inspection apparatus'20128,115,915'Defect inspection method and apparatus'20128,035,808'Surface defect inspection method and apparatus'20117,965,386'Method and its apparatus for inspecting defects'20117,916,288'Defect inspection method'20117,869,024'Method and its apparatus for inspecting defects'20117,719,673'Defect inspecting device for sample surface and defect detection method therefor'20107,710,557'Surface defect inspection method and apparatus'20107,675,613'Defect inspection method'20107,216,360'Device management system, management client, controller server, method for managing usage context of device, and recording medium which records the method'20075,515,333'Semiconductor memory'19965,359,569'Semiconductor memory'19944,954,122'Differential gear apparatus with worm gears'19904,878,400'Bias ratio levelling apparatus of a worm gear type differential'19894,821,946'Soldering method'19894,653,352'Automatic transmission system for automobiles having hydraulic and electronic control systems'19874,188,838'Control apparatus of a transfer mechanism'19804,138,906'Power distributing apparatus for vehicles'1979

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1979–1990Based in Chiryu, JP· patent location history
1980Based in Toyota, JP· patent location history
1989–1996Based in Hadano, JP· patent location history
2007–2019Based in Yokohama, JP· patent location history
2010–2019Patents assigned to HITACHI HIGH TECH CORP (32)· patent assignee history
2012–2015Patents assigned to NAKAO TOSHIYUKI (20)· patent assignee history
2012–2015Patents assigned to URANO YUTA (18)· patent assignee history
2012–2015Patents assigned to OSHIMA YOSHIMASA (12)· patent assignee history
2012–2015Patents assigned to MARUYAMA SHIGENOBU (8)· patent assignee history
2015–2019Based in Tokyo, JP· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
HITACHI HIGH TECH CORP322010–2019
NAKAO TOSHIYUKIself202012–2015
URANO YUTA182012–2015
OSHIMA YOSHIMASA122012–2015
MARUYAMA SHIGENOBU82012–2015
Locations
LocationPatentsSpan
Yokohama, JP312007–2019
Chiryu, JP41979–1990
Hadano, JP31989–1996
Tokyo, JP22015–2019
Toyota, JP11980