Inventor
Donald J. Svetkoff
Inventor
Ann Arbor, MI, US
Overview
Patents· 41 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
B23Kprimary
B23KSoldering or unsoldering15%
H05KPrinted circuits14%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h1014%
G01BMeasuring length, thickness or similar linear dimensions11%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1011%
H10DInorganic electric semiconductor devices10%
G01NInvestigating or analysing materials by determining their chemical or physical properties8%
G02BOptical elements, systems or apparatus7%
G01SRadio direction-finding2%
H01SDevices using the process of light amplification by stimulated emission of radiation [laser] to amplify or generate light2%
PatentTitleYear
8,809,734'Methods and systems for thermal-based laser processing a multi-material device'20148,269,137'Link processing with high speed beam deflection'20128,253,066'Laser-based method and system for removing one or more target link structures'20128,217,304'Methods and systems for thermal-based laser processing a multi-material device'20127,955,905'Methods and systems for thermal-based laser processing a multi-material device'20117,955,906'Methods and systems for thermal-based laser processing a multi-material device'20117,838,794'Laser-based method and system for removing one or more target link structures'20107,723,642'Laser-based system for memory link processing with picosecond lasers'20107,469,831'Laser-based method and system for processing targeted surface material and article produced thereby'20087,394,476'Methods and systems for thermal-based laser processing a multi-material device'20087,382,389'Methods and systems for thermal-based laser processing a multi-material device'20087,199,882'Method and system for high speed measuring of microscopic targets'20077,192,846'Methods and systems for processing a device, methods and systems for modeling same and the device'20077,181,058'Method and system for inspecting electronic components mounted on printed circuit boards'20077,148,447'Method and apparatus for laser marking by ablation'20066,989,508'High-speed, precision, laser-based method and system for processing material of one or more targets within a field'20066,979,798'Laser system and method for material processing with ultra fast lasers'20056,972,268'Methods and systems for processing a device, methods and systems for modeling same and the device'20056,777,645'High-speed, precision, laser-based method and system for processing material of one or more targets within a field'20046,750,974'Method and system for 3D imaging of target regions'20046,703,582'Energy-efficient method and system for processing target material using an amplified, wavelength-shifted pulse train'20046,639,177'Method and system for processing one or more microstructures of a multi-material device'20036,496,270'Method and system for automatically generating reference height data for use in a three-dimensional inspection system'20026,452,686'Method and system for high speed measuring of microscopic targets'20026,366,357'Method and system for high speed measuring of microscopic targets'20026,340,806'Energy-efficient method and system for processing target material using an amplified, wavelength-shifted pulse train'20026,249,347'Method and system for high speed measuring of microscopic targets'20016,181,425'Method and system for high speed measuring of microscopic targets'20016,177,998'Method and system for high speed measuring of microscopic targets'20016,098,031'Versatile method and system for high speed, 3D imaging of microscopic targets'20006,028,671'Method and system for suppressing unwanted reflections in an optical system'2000RE036560'Method and system for high-speed, high-resolution, 3-D imaging of an object at a vision station'20005,822,486'Scanned remote imaging method and system and method of determining optimum design characteristics of a filter for use therein'19985,815,275'Method and system for triangulation-based, 3-D imaging utilizing an angled scanning beam of radiant energy'19985,812,269'Triangulation-based 3-D imaging and processing method and system'19985,768,461'Scanned remote imaging method and system and method of determining optimum design characteristics of a filter for use therein'19985,654,800'Triangulation-based 3D imaging and processing method and system'19975,617,209'Method and system for triangulation-based, 3-D imaging utilizing an angled scaning beam of radiant energy'19975,024,529'Method and system for high-speed, high-resolution, 3-D imaging of an object at a vision station'19914,928,313'Method and system for automatically visually inspecting an article'19904,796,997'Method and system for high-speed, 3-D imaging of an object at a vision station'1989Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1989–2014Based in Ann Arbor, MI, US· patent location history
1997–2002Patents assigned to GEN SCANNING INC (13)· patent assignee history
2003–2008Patents assigned to GSI LUMONICS CORP (7)· patent assignee history
2006–2012Patents assigned to GSI GROUP CORP (13)· patent assignee history
2012–2014Patents assigned to CORDINGLEY JAMES J (4)· patent assignee history
2012–2014Patents assigned to EHRMANN JONATHAN S (4)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| GEN SCANNING INC | 13 | 1997–2002 |
| GSI GROUP CORP | 13 | 2006–2012 |
| GSI LUMONICS CORP | 7 | 2003–2008 |
| CORDINGLEY JAMES J | 4 | 2012–2014 |
| EHRMANN JONATHAN S | 4 | 2012–2014 |
Locations
| Location | Patents | Span |
|---|---|---|
| Ann Arbor, MI, US | 41 | 1989–2014 |