Inventor
Anil A. Desai
Inventor
San Jose, CA, US
Overview
Patents· 5 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
H01Jprimary
H01JElectric discharge tubes or discharge lamps43%
G02BOptical elements, systems or apparatus29%
G01RMeasuring electric variables14%
Y10TTechnical subjects covered by former us classification14%
PatentTitleYear
6,791,095'Method and system of using a scanning electron microscope in semiconductor wafer inspection with Z-stage focus'20045,578,821'Electron beam inspection system and method'19965,502,306'Electron beam inspection system and method'19964,647,764'Rotational and focusing apparatus for turret mounted lenses'19874,604,910'Apparatus for accurately positioning an object at each of two locations'1986Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1986–1996Patents assigned to KLA INSTR CORP (4)· patent assignee history
1986–2004Based in San Jose, CA, US· patent location history
2004Patents assigned to HERMES MICROVISION TAIWAN INC (1)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| KLA INSTR CORP | 4 | 1986–1996 |
| HERMES MICROVISION TAIWAN INC | 1 | 2004 |
Locations
| Location | Patents | Span |
|---|---|---|
| San Jose, California, US | 5 | 1986–2004 |