Inventor
Franco Stellari
Inventor
Waldwick, NJ, US
Overview
Patents· 58 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Rprimary
G01RMeasuring electric variables44%
G06FElectric digital data processing14%
G06TImage data processing or generation, in general9%
H03KPulse technique5%
G01JMeasurement of intensity, velocity, spectral content, polarisation, phase or pulse characteristics of infrared, visible or ultraviolet light4%
H04NPictorial communication, e.g. television4%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h104%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h104%
G02BOptical elements, systems or apparatus2%
Y10TTechnical subjects covered by former us classification2%
PatentTitleYear
11,106,764Integrated circuit identification202111,105,856Detection of performance degradation in integrated circuits202111,061,063Method for the characterization and monitoring of integrated circuits202111,036,832Integrated circuit identification202110,928,448Automated scan chain diagnostics using emission202110,895,596Method and system for quickly identifying circuit components in an emission image202110,755,404Integrated circuit defect detection using pattern images202010,755,397Automated focusing of a microscope of an optical inspection system202010,591,539Automated scan chain diagnostics using emission202010,574,240Ring oscillator structures to determine local voltage value202010,571,520Scan chain latch design that improves testability of integrated circuits202010,564,213Dielectric breakdown monitor202010,552,278Non-destructive analysis to determine use history of processor202010,515,183Integrated circuit identification201910,515,181Integrated circuit identification201910,429,433Method for the characterization and monitoring of integrated circuits201910,386,409Non-destructive determination of components of integrated circuits201910,379,152Method for the characterization and monitoring of integrated circuits201910,302,697Automated scan chain diagnostics using emission201910,147,175Detection of hardware trojan using light emissions with sacrificial mask201810,102,090Non-destructive analysis to determine use history of processor20189,939,486Integrated time dependent dielectric breakdown reliability testing20189,930,325'Minimum-spacing circuit design and layout for PICA'20189,874,601Integrated time dependent dielectric breakdown reliability testing20189,830,702Dynamic real-time layout overlay20179,678,152'Scan chain latch design that improves testability of integrated circuits'20179,632,136'Precise estimation of arrival time of switching events close in time and space'20179,581,642'Method and system for quickly identifying circuit components in an emission image'20179,568,540'Method for the characterization and monitoring of integrated circuits'20179,557,369'Integrated time dependent dielectric breakdown reliability testing'20179,448,277'Integrated time dependent dielectric breakdown reliability testing'20169,372,231'Scan chain latch design that improves testability of integrated circuits'20169,261,561'Scan chain latch design that improves testability of integrated circuits'20169,229,044'Minimum-spacing circuit design and layout for PICA'20169,086,457'Scan chain latch design that improves testability of integrated circuits'20159,081,049'Minimum-spacing circuit design and layout for PICA'20159,075,106'Detecting chip alterations with light emission'20158,750,595'Registering measured images to layout data'20148,635,582'Navigating analytical tools using layout software'20148,412,993'Self-adjusting critical path timing of multi-core VLSI chip'20138,331,726'Creating emission images of integrated circuits'20128,312,413'Navigating analytical tools using layout software'20128,193,009'Apparatus and methods for packaging electronic devices for optical testing'20128,131,056'Constructing variability maps by correlating off-state leakage emission images to layout information'20128,115,170'Method and apparatus for creating time-resolved emission images of integrated circuits using a single-point single-photon detector and a scanning system'20128,041,437'System and method for virtual control of laboratory equipment'20117,927,898'Apparatus and methods for packaging electronic devices for optical testing'20117,868,606'Process variation on-chip sensor'20117,788,058'Method and apparatus for diagnosing broken scan chain based on leakage light emission'20107,635,904'Apparatus and methods for packaging electronic devices for optical testing'20097,612,571'System and method for estimation of integrated circuit signal characteristics using optical measurements'20097,480,882'Measuring and predicting VLSI chip reliability and failure'20097,446,550'Enhanced signal observability for circuit analysis'20087,426,448'Method and apparatus for diagnosing broken scan chain based on leakage light emission'20087,378,859'System and method for estimation of integrated circuit signal characteristics using optical measurements'20087,355,419'Enhanced signal observability for circuit analysis'20087,239,157'Optical trigger for PICA technique'20077,154,287'Method and apparatus for light-controlled circuit characterization'2006Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2006–2021Patents assigned to IBM (58)· patent assignee history
2006–2012Based in Ho-Ho-Kus, NJ, US· patent location history
2009–2021Based in Waldwick, NJ, US· patent location history
2012–2017Patents assigned to STELLARI FRANCO (13)· patent assignee history
2012–2017Patents assigned to SONG PEILIN (11)· patent assignee history
2012–2013Based in Yorktown Heights, NY, US· patent location history
2015–2017Patents assigned to PFEIFFER DIRK (3)· patent assignee history
2016–2017Patents assigned to CHEN JIFENG (2)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| IBM | 58 | 2006–2021 |
| STELLARI FRANCOself | 13 | 2012–2017 |
| SONG PEILIN | 11 | 2012–2017 |
| PFEIFFER DIRK | 3 | 2015–2017 |
| CHEN JIFENG | 2 | 2016–2017 |
Locations
| Location | Patents | Span |
|---|---|---|
| Waldwick, New Jersey, US | 45 | 2009–2021 |
| Ho-Ho-Kus, New Jersey, US | 11 | 2006–2012 |
| Yorktown Heights, New York, US | 2 | 2012–2013 |