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Inventor

Itay Zauer

Inventor
Rehovot, IL

Overview

3→
Patents
2016–2019
Patent span
Physics
Primary field (CPC G)

Patents· 3 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G03Fprimary
G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices27%
G06TImage data processing or generation, in general27%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h1027%
G06KGraphical data reading18%
PatentTitleYear
10,354,376Technique for measuring overlay between layers of a multilayer structure20199,916,652'Technique for measuring overlay between layers of a multilayer structure'20189,530,199'Technique for measuring overlay between layers of a multilayer structure'2016

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

2016–2019Patents assigned to APPLIED MATERIALS ISRAEL LTD (3)· patent assignee history
2016Based in Rohovot, IL· patent location history
2018–2019Based in Rehovot, IL· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
APPLIED MATERIALS ISRAEL LTD32016–2019
Locations
LocationPatentsSpan
Rehovot, IL22018–2019
Rohovot, IL12016