Inventor
A. Nicholas Sporck
Inventor
Saratoga, CA, US
Overview
Patents· 25 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Rprimary
G01RMeasuring electric variables34%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1018%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h108%
B23KSoldering or unsoldering7%
C25DProcesses for the electrolytic or electrophoretic production of coatings7%
H01RElectrically-conductive connections7%
H05KPrinted circuits7%
Y02PClimate change mitigation technologies in the production or processing of goods7%
Y10TTechnical subjects covered by former us classification3%
G01NInvestigating or analysing materials by determining their chemical or physical properties1%
PatentTitleYear
8,872,534'Method and apparatus for testing devices using serially controlled intelligent switches'20148,400,176'Wafer level contactor'20137,977,959'Method and apparatus for testing devices using serially controlled intelligent switches'20117,952,375'AC coupled parameteric test probe'20117,852,094'Sharing resources in a system for testing semiconductor devices'20107,821,255'Test system with wireless communications'20107,675,311'Wireless test system'20107,659,736'Mechanically reconfigurable vertical tester interface for IC probing'20107,649,366'Method and apparatus for switching tester resources'20107,616,016'Probe card assembly and kit'20097,592,821'Apparatus and method for managing thermally induced motion of a probe card assembly'20097,550,842'Integrated circuit assembly'20097,548,055'Testing an electronic device using test data from a plurality of testers'20097,352,196'Probe card assembly and kit'20087,285,968'Apparatus and method for managing thermally induced motion of a probe card assembly'20077,230,437'Mechanically reconfigurable vertical tester interface for IC probing'20077,218,094'Wireless test system'20077,202,687'Systems and methods for wireless semiconductor device testing'20077,116,119'Probe card with coplanar daughter card'20067,064,566'Probe card assembly and kit'20067,061,257'Probe card assembly'20066,856,150'Probe card with coplanar daughter card'20056,838,893'Probe card assembly'20055,867,033'Circuit for testing the operation of a semiconductor device'19995,646,406'Stroboscopic photometer'1997Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1997–1999Patents assigned to LSI LOGIC CORP (2)· patent assignee history
1997–2014Based in Saratoga, CA, US· patent location history
2005–2014Patents assigned to FORMFACTOR INC (23)· patent assignee history
2013–2014Patents assigned to SPORCK ALISTAIR NICHOLAS (2)· patent assignee history
2013Patents assigned to ARKIN BRIAN J (1)· patent assignee history
2014Patents assigned to BERRY TOMMIE EDWARD (1)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| FORMFACTOR INC | 23 | 2005–2014 |
| LSI LOGIC CORP | 2 | 1997–1999 |
| SPORCK ALISTAIR NICHOLASself | 2 | 2013–2014 |
| ARKIN BRIAN J | 1 | 2013 |
| BERRY TOMMIE EDWARD | 1 | 2014 |
Locations
| Location | Patents | Span |
|---|---|---|
| Saratoga, California, US | 25 | 1997–2014 |