LexDanaLexDanabeta
Inventor

Yukihiro Shibata

Inventor
Fujisawa, JP

Overview

91→
Patents
1994–2021
Patent span
Physics
Primary field (CPC G)

Patents· 91 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties36%
G06TImage data processing or generation, in general9%
G06FElectric digital data processing6%
H04NPictorial communication, e.g. television6%
G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices5%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h105%
G02BOptical elements, systems or apparatus3%
Y02DClimate change mitigation technologies in information and communication technologies [ict], i.e. information and communication technologies aiming at the reduction of their own energy use3%
G03GElectrography2%
G06KGraphical data reading2%
PatentTitleYear
11,069,905Fuel cell separator202110,955,361Defect inspection apparatus and pattern chip202110,948,424Defect inspection device, pattern chip, and defect inspection method202110,838,672Image forming apparatus202010,754,596Image forming apparatus202010,684,803Image forming apparatus for executing print job202010,656,702Image forming apparatus that makes a state transition to enter a power saving state202010,599,371Image forming apparatus202010,536,601Information processing device202010,536,588Image forming apparatus202010,412,239Image forming apparatus and management system201910,326,010Semiconductor device and method of manufacturing the semiconductor device20199,976,966Defect inspection method and its device20189,935,988Information processing device and information processing method20189,922,275'Image forming apparatus comprising a punch mechanism forming a punch hole in a sheet on which an image is formed by an image forming unit'20189,606,071'Defect inspection method and device using same'20179,523,648'Defect inspection device and defect inspection method'20169,513,228'Defect inspection method and its device'20169,470,640'Defect inspection method and defect inspection device'20169,360,818'Image forming apparatus and image formation method having toner saving mode'20169,329,137'Defect inspection method and device using same'20169,310,318'Defect inspection method and defect inspection device'20169,291,574'Defect inspection method and defect inspection device'20169,255,793'Defect inspection method and device thereof'20169,239,283'Defect inspection method and device therefor'20169,182,592'Optical filtering device, defect inspection method and apparatus therefor'20158,970,836'Defect inspecting apparatus and defect inspecting method'20158,958,062'Defect inspection method and device using same'20158,922,764'Defect inspection method and defect inspection apparatus'20148,885,037'Defect inspection method and apparatus therefor'20148,830,465'Defect inspecting apparatus and defect inspecting method'20148,804,110'Fault inspection device and fault inspection method'20148,804,112'Method of defect inspection and device of defect inspection'20148,751,702'Communication processing device that stores communication data in buffers, image forming apparatus, and method of communication processing'20148,711,347'Defect inspection method and device therefor'20148,681,328'Dark-field defect inspecting method, dark-field defect inspecting apparatus, aberration analyzing method, and aberration analyzing apparatus'20148,670,116'Method and device for inspecting for defects'20148,454,754'Cleaning method and method for manufacturing electronic device'20138,416,292'Defect inspection apparatus and method'20138,416,402'Method and apparatus for inspecting defects'20138,303,797'Cleaning system and cleaning method'20128,236,161'Apparatus for electrolyzing sulfuric acid, method of performing electrolysis, and apparatus for processing a substrate'20128,228,494'Apparatus for inspecting defects'20128,203,706'Method and apparatus for inspecting defects'20128,121,398'Method and apparatus for inspecting defects'20128,105,728'Polyelectrolyte material, method for producing polyelectrolyte material, polyelectrolyte component, fuel cell, and method for producing fuel cell'20128,107,717'Defect inspection method and apparatus'20128,004,666'Apparatus for inspecting defects'20117,916,929'Defect inspection method and apparatus'20117,859,656'Defect inspection method and system'20107,826,047'Apparatus and method for optical inspection'20107,714,997'Apparatus for inspecting defects'20107,599,545'Method and its apparatus for inspecting defects'20097,567,343'Method and apparatus for detecting defects on a wafer'20097,512,259'Defect inspection method and apparatus'20097,508,973'Method of inspecting defects'20097,499,162'Method and apparatus for observing and inspecting defects'20097,492,452'Defect inspection method and system'20097,463,350'Method and apparatus for detecting defects of a sample using a dark field signal and a bright field signal'20087,440,092'Method and apparatus for detecting defects'20087,400,393'Method and apparatus for detecting defects in a specimen utilizing information concerning the specimen'20087,372,561'Method and apparatus for inspecting defects and a system for inspecting defects'20087,359,044'Method and apparatus for inspecting pattern defects'20087,299,147'Systems for managing production information'20077,274,813'Defect inspection method and apparatus'20077,271,892'Method and apparatus for inspecting defects'20077,251,024'Defect inspection method and apparatus therefor'20077,173,693'Method for inspecting defects and an apparatus of the same'20077,161,671'Method and apparatus for inspecting defects'20077,142,294'Method and apparatus for detecting defects'20067,092,095'Method and apparatus for observing and inspecting defects'20066,947,587'Defect inspection method and apparatus'20056,874,466'Intake valve device'20056,850,320'Method for inspecting defects and an apparatus for the same'20056,819,416'Defect inspection method and apparatus therefor'20046,762,831'Method and apparatus for inspecting defects'20046,690,469'Method and apparatus for observing and inspecting defects'20046,674,890'Defect inspection method and apparatus therefor'20046,654,112'Apparatus and method for inspecting defects'20036,621,571'Method and apparatus for inspecting defects in a patterned specimen'20036,556,290'Defect inspection method and apparatus therefor'20036,400,454'Apparatus and method for inspector defects'20026,169,282'Defect inspection method and apparatus therefor'20016,132,162'Storage construction for spare tire of motor vehicle'20006,091,075'Automatic focus detection method, automatic focus detection apparatus, and inspection apparatus'20005,862,852'Production method for a cylinder block of an internal combustion engine'19995,684,565'Pattern detecting method, pattern detecting apparatus, projection exposing apparatus using the same and exposure system'19975,614,926'Word processor with a handwriting text processing function'19975,583,543'Pen input processing apparatus'19965,329,289'Data processor with rotatable display'19945,302,999'Illumination method, illumination apparatus and projection exposure apparatus'1994

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1994–2015Patents assigned to HITACHI LTD (27)· patent assignee history
2000–2016Based in Fujisawa, JP· patent location history
2007–2021Patents assigned to HITACHI HIGH TECH CORP (40)· patent assignee history
2009–2012Based in Kanagawa, JP· patent location history
2012–2016Patents assigned to SHIBATA YUKIHIRO (25)· patent assignee history
2012–2013Based in Fukuoka, JP· patent location history
2014–2020Patents assigned to KYOCERA DOCUMENT SOLUTIONS INC (12)· patent assignee history
2014–2016Patents assigned to HONDA TOSHIFUMI (10)· patent assignee history
2014–2020Based in Osaka, JP· patent location history
2015–2021Based in Tokyo, JP· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
HITACHI HIGH TECH CORP402007–2021
HITACHI LTD271994–2015
SHIBATA YUKIHIROself252012–2016
KYOCERA DOCUMENT SOLUTIONS INC122014–2020
HONDA TOSHIFUMI102014–2016
Locations
LocationPatentsSpan
Fujisawa, JP512000–2016
Tokyo, JP122015–2021
Osaka, JP122014–2020
Fukuoka, JP22012–2013
Kanagawa, JP22009–2012