Inventor
Katsuyoshi Yamaguchi
Inventor
Tokyo, JP
Overview
Patents· 25 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G02Bprimary
G02BOptical elements, systems or apparatus16%
H01GCapacitors16%
C04BLime, magnesia11%
B82YSpecific uses or applications of nanostructures8%
C12MApparatus for enzymology or microbiology6%
Y10TTechnical subjects covered by former us classification6%
H01BCables5%
C01GCompounds containing metals not covered by subclasses c01d or c01f3%
C01PIndexing scheme relating to structural and physical aspects of solid inorganic compounds3%
C25DProcesses for the electrolytic or electrophoretic production of coatings3%
PatentTitleYear
11,025,222Vibration element, manufacturing method of vibration element, physical quantity sensor, inertial measurement device, electronic apparatus, and vehicle202111,025,211Amplification apparatus and transmission apparatus20218,867,126'Microscope controller and microscope system having microscope controller'20148,699,131'Microscope controller and microscope system comprising microscope controller'20148,383,535'Laminated ceramic capacitor'20138,305,732'Dielectric ceramic and capacitor'20128,184,428'Dielectric ceramic and capacitor'20128,107,219'Dielectric ceramic and capacitor'20128,097,552'Dielectric ceramics and capacitor'2012RE042948'Optical microscope apparatus, optical element arranging method, and storage medium'20117,968,486'Dielectric ceramics and capacitor'20117,957,119'Metal films, methods for production thereof, methods for production of laminated electronic components, and laminated electronic components'20117,910,355'Culture observation apparatus'20117,816,126'Culture observation apparatus, sample tray heat-insulating device and lid'20107,595,188'Observation apparatus'20097,486,886'Photo-micrographing device and its control method'20097,382,531'Microscope and method of preventing dew condensation on objective lens'20087,333,265'Microscope apparatus'20087,324,324'Multilayer electronic component and manufacturing method thereof'20087,224,522'Optical microscope apparatus, optical element arranging method, and storage medium'20077,224,570'Process for preparing multilayer ceramic capacitor and the multilayer ceramic capacitor'20077,136,708'Control system, control apparatus, and control method for microscope stage'20066,898,069'Multilayer electronic component and manufacturing method thereof'20056,636,353'Optical element change-over control apparatus and microscope using the same'20035,188,572'Internally meshing planetary gear structure'1993Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2005–2013Patents assigned to KYOCERA CORP (10)· patent assignee history
2005–2008Based in Kokubu, JP· patent location history
2006–2014Patents assigned to OLYMPUS CORP (11)· patent assignee history
2006–2014Based in Tokyo, JP· patent location history
2011–2014Patents assigned to YAMAGUCHI KATSUYOSHI (7)· patent assignee history
2011Patents assigned to KAWANABE HIDEYUKI (1)· patent assignee history
2011–2012Based in Kagoshima, JP· patent location history
2011–2013Based in Kirishima, JP· patent location history
2012Patents assigned to KUKI RYOTA (1)· patent assignee history
2021Based in Ina, JP· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| OLYMPUS CORP | 11 | 2006–2014 |
| KYOCERA CORP | 10 | 2005–2013 |
| YAMAGUCHI KATSUYOSHIself | 7 | 2011–2014 |
| KAWANABE HIDEYUKI | 1 | 2011 |
| KUKI RYOTA | 1 | 2012 |
Locations
| Location | Patents | Span |
|---|---|---|
| Tokyo, JP | 10 | 2006–2014 |
| Kagoshima, JP | 4 | 2011–2012 |
| Kirishima, JP | 3 | 2011–2013 |
| Kokubu, JP | 3 | 2005–2008 |
| Ina, JP | 1 | 2021 |