Inventor
Jason Cleveland
Inventor
Ventura, CA, US
Overview
Patents· 47 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Qprimary
G01QScanning-probe techniques or apparatus34%
B82YSpecific uses or applications of nanostructures19%
G01BMeasuring length, thickness or similar linear dimensions9%
Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests7%
G01DMeasuring not specially adapted for a specific variable7%
H01FMagnets7%
G02BOptical elements, systems or apparatus5%
G21KHandling of particles or ionising radiation not otherwise provided for4%
G01NInvestigating or analysing materials by determining their chemical or physical properties3%
B23QDetails, components, or accessories for machine tools, e.g. arrangements for copying or controlling2%
PatentTitleYear
10,705,114Metrological scanning probe microscope202010,481,155Proteomic assay using quantum sensors201910,416,190Modular atomic force microscope with environmental controls201910,337,890Integrated micro actuator and LVDT for high precision position measurements201910,338,096Metrological scanning probe microscope201910,107,832Fully digitally controller for cantilever-based instruments201810,054,612Optical beam positioning unit for atomic force microscope20189,921,242'Automated atomic force microscope and the operation thereof'20189,804,193'Metrological scanning probe microscope'20179,689,890'Fully digitally controller for cantilever-based instruments'20179,581,616'Modular atomic force microscope with environmental controls'20179,518,814'Integrated micro actuator and LVDT for high precision position measurements'20169,383,388'Automated atomic force microscope and the operation thereof'20169,383,386'Optical beam positioning unit for atomic force microscope'20169,097,737'Modular atomic force microscope with environmental controls'20159,063,042'Nanoindenter'20158,925,376'Fully digitally controller for cantilever-based instruments'20158,502,525'Integrated micro actuator and IVDT for high precision position measurements'20138,459,102'Digital Q control for enhanced measurement capability in cantilever-based instruments'20138,370,960'Modular atomic force microscope'20138,205,488'Fully digitally controller for cantilever-based instruments'20128,196,458'Nanoindenter'20128,042,383'Digital Q control for enhanced measurement capability in cantilever-based instruments'20117,937,991'Fully digitally controller for cantilever-based instruments'20117,685,869'Nanoindenter'20107,501,615'Flexure assembly for a scanner'20097,459,904'Precision position sensor using a nonmagnetic coil form'20087,387,017'Digital Q control for enhanced measurement capability in cantilever-based instruments'20087,372,254'Linear force detecting element formed without ferromagnetic materials which produces a resolution in a range of microns or less'20087,271,582'Linear variable differential transformers for high precision position measurements'20077,266,997'Tactile force and/or position feedback for cantilever-based force measurement instruments'20077,262,592'Linear variable differential transformers for high precision position measurements'20077,234,342'Fully digital controller for cantilever-based instruments'20077,233,140'Position sensing assembly with sychronizing capability'20077,165,445'Digital control of quality factor in resonant systems including cantilever based instruments'20077,084,384'Diffractive optical position detector in an atomic force microscope having a moveable cantilever'20067,038,443'Linear variable differential transformers for high precision position measurements'20067,002,138'Flexure assembly for a scanner'20066,884,981'Diffractive optical position detector'20056,720,551'Flexure assembly for a scanner'20046,410,907'Flexure assembly for a scanner'20026,323,483'High bandwidth recoiless microactuator'20016,246,052'Flexure assembly for a scanner'20016,038,916'Method and apparatus for measuring energy dissipation by a probe during operation of an atomic force microscope'20005,925,818'Method and apparatus for magnetic force control of a scanning probe'19995,825,020'Atomic force microscope for generating a small incident beam spot'19985,670,712'Method and apparatus for magnetic force control of a scanning probe'1997Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1997–2020Based in Santa Barbara, CA, US· patent location history
1998–2019Based in Ventura, CA, US· patent location history
2005–2013Patents assigned to ASYLUM RESEARCH CORP (17)· patent assignee history
2008–2016Patents assigned to CLEVELAND JASON (9)· patent assignee history
2008–2016Patents assigned to PROKSCH ROGER (8)· patent assignee history
2013–2019Patents assigned to OXFORD INSTR AFM INC (7)· patent assignee history
2013–2019Patents assigned to OXFORD INSTR PLC (7)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| ASYLUM RESEARCH CORP | 17 | 2005–2013 |
| CLEVELAND JASONself | 9 | 2008–2016 |
| PROKSCH ROGER | 8 | 2008–2016 |
| OXFORD INSTR AFM INC | 7 | 2013–2019 |
| OXFORD INSTR PLC | 7 | 2013–2019 |
Locations
| Location | Patents | Span |
|---|---|---|
| Ventura, California, US | 39 | 1998–2019 |
| Santa Barbara, California, US | 8 | 1997–2020 |