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Inventor

Yoko Matsuda

Inventor
Ehime, JP

Overview

2→
Patents
2013
Patent span
Physics
Primary field (CPC G)

Patents· 2 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties67%
Y10TTechnical subjects covered by former us classification33%
PatentTitleYear
8,481,330'Method for analyzing sample solution and apparatus for analyzing sample solution'20138,447,084'Chromatography inspection apparatus and method for judging degradation of chromatography specimen'2013

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

2013Patents assigned to AGA MASAHIRO (2)· patent assignee history
2013Patents assigned to KUROKAWA HIDEYUKI (2)· patent assignee history
2013Patents assigned to MATSUDA YOKO (2)· patent assignee history
2013Patents assigned to PANASONIC CORP (2)· patent assignee history
2013Patents assigned to TAKAHASHI MIE (2)· patent assignee history
2013Based in Ehime, JP· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
AGA MASAHIRO22013
KUROKAWA HIDEYUKI22013
MATSUDA YOKOself22013
PANASONIC CORP22013
TAKAHASHI MIE22013
Locations
LocationPatentsSpan
Ehime, JP22013