Inventor

Kazuo Moriya

Inventor

Ageo, JP

Overview

30→

Patents

1976–2009

Patent span

Physics

Primary field (CPC G)

Patents· 30 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Nprimary

G01NInvestigating or analysing materials by determining their chemical or physical properties51%

H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h107%

G01BMeasuring length, thickness or similar linear dimensions4%

G06TImage data processing or generation, in general4%

H04NPictorial communication, e.g. television4%

Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests4%

B23QDetails, components, or accessories for machine tools, e.g. arrangements for copying or controlling2%

B24BMachines, devices, or processes for grinding or polishing2%

B27KProcesses, apparatus or selection of substances for impregnating, staining, dyeing, bleaching of wood or similar materials, or treating of wood or similar materials with permeant liquids, not otherwise provided for2%

C30BSingle-crystal growth2%

PatentTitleYear

7,633,617'Defective particle measuring apparatus and defective particle measuring method'2009 6,760,060'Observation apparatus for observing a defect in a moving target object using scattered light'2004 6,236,056'Defect evaluation apparatus for evaluating defects and shape information thereof in an object or on the surface of an object'2001 6,118,133'Apparatus and method for observing defect having marks making means'2000 6,020,958'Atomic absorption spectrophotometer'2000 5,995,216'Pattern inspection apparatus'1999 5,982,922'Pattern inspection apparatus and method'1999 5,978,082'Atomic absorptiometer and a metal specimen atomic vapor generation apparatus used in the atomic absorotiometer'1999 5,970,624'Method of drying wood and method of subjecting wood to impregnative treatment'1999 5,892,241'Apparatus and method for the inspection of scattered resist'1999 5,822,059'Atomic absorption spectrophotometer and graphite tube type cuvette used for the same'1998 5,808,744'Apparatus for inspecting repetitive patterns'1998 5,801,827'Analysis device using chemical combustion flame'1998 5,786,887'Atomic absorption spectrophotometer and atomic absorption spectrochemical analysis'1998 5,748,320'Wiring pattern line width measuring apparatus'1998 5,471,298'Method and apparatus for measuring size of particle or defect'1995 5,428,655'Method and apparatus for three-dimensional detection of particles'1995 5,424,536'Substrate internal defect and external particle detecting apparatus using s-polarized and p-polarized light'1995 5,381,016'Method and apparatus for measuring photoluminescence in crystal'1995 5,298,963'Apparatus for inspecting the surface of materials'1994 5,196,716'Method and apparatus for measuring internal defects for position and depth'1993 5,108,178'Atomic absorption spectrophotometer and electromagnetic shut-off valve for use therein'1992 5,106,189'Zeeman atomic absorption spectrophotometer'1992 5,077,475'Method for quantitative evaluation method of optical absorption image for determination of resistivity dispersion'1991 4,765,925'Solid state laser hosts'1988 4,432,643'Apparatus for atomizing a sample including a slidable pressure maintaining arrangement'1984 4,202,628'Flameless atomizer'1980 D0254969'Baby stroller'1980 4,179,931'Pneumatic metal sampler'1979 3,952,458'Grinding machine with feed rate changing apparatus'1976

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1979–2009Based in Tokyo, JP· patent location history

1980–2000Patents assigned to HITACHI LTD (9)· patent assignee history

1980Patents assigned to COMBI CO (1)· patent assignee history

1980–1992Based in Katsuta, JP· patent location history

1988–2004Patents assigned to MITSUI MINING & SMELTING CO (16)· patent assignee history

1988–2004Based in Ageo, JP· patent location history

1998–2000Based in Hitachinaka, JP· patent location history

1999Patents assigned to COMMON FACILITY CO OPERATIVES (1)· patent assignee history

1999Patents assigned to MORIYA EMIKO (1)· patent assignee history

1999Based in Tokorozawa, JP· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees

Assignee	Patents	Span
MITSUI MINING & SMELTING CO	16	1988–2004
HITACHI LTD	9	1980–2000
COMBI CO	1	1980
COMMON FACILITY CO OPERATIVES	1	1999
MORIYA EMIKO	1	1999

Locations

Location	Patents	Span
Ageo, JP	14	1988–2004
Hitachinaka, JP	5	1998–2000
Tokyo, JP	4	1979–2009
Katsuta, JP	4	1980–1992
Tokorozawa, JP	1	1999