Inventor

Ping He

Inventor

Lincoln, NE, US

Overview

1987–2020

Patent span

Physics

Primary field (CPC G)

Patents· 100 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Nprimary

G01NInvestigating or analysing materials by determining their chemical or physical properties35%

G01JMeasurement of intensity, velocity, spectral content, polarisation, phase or pulse characteristics of infrared, visible or ultraviolet light24%

G02BOptical elements, systems or apparatus9%

G06FElectric digital data processing5%

H04LTransmission of digital information, e.g. telegraphic communication3%

H01MProcesses or means, e.g. batteries, for the direct conversion of chemical energy into electrical energy2%

H02GInstallation of electric cables or lines, or of combined optical and electric cables or lines2%

Y02EReduction of greenhouse gas [ghg] emissions, related to energy generation, transmission or distribution2%

G06QInformation and communication technology [ict] specially adapted for administrative, commercial, financial, managerial or supervisory purposes2%

H04WWireless communication networks2%

PatentTitleYear

10,859,439Reflectometer, spectrophotometer, ellipsometer or polarimeter system including sample imaging system that simultaneously meets scheimpflug condition and overcomes keystone error2020 10,845,965Collaboration management system2020 10,693,113Battery electrode and secondary battery using the same2020 10,627,288Systems and methods for producing a more uniform intensity wavelength dispersed beam of electromagnetic radiation entering a multielement detector, while maintaining information content therein2020 10,612,976Systems and methods for producing a more uniform intensity wavelength dispersed beam of electromagnetic radiation entering a multi-element detector, while maintaining information content therein2020 10,338,362Beam focusing and reflecting optics with enhanced detector system2019 D0849841Metered dose inhaler label2019 10,255,121Stackable system event clearinghouse for cloud computing2019 10,247,611Enhanced detector operation made possible by application of a functional plurality of gratings and combination dichroic beam splitter-prisms2019 10,209,999Devices, updaters, methods for controlling a device, and methods for controlling an updater2019 10,180,377Electric wheel test bed2019 10,166,723Method of edge sealing for secondary lithium battery2019 10,066,989Information maintenance, intensity attenuation, and angle/plane of incidence control in electromagentic beams2018 10,067,578Profile management method2018 10,061,068Deviation angle self-compensating substantially achromatic retarder2018 10,018,815Beam focusing and reflective optics2018 9,961,190System and method for performing mobile telephone calling and/or messaging operations in-game during computer game application execution2018 9,933,357Elliposometer system with polarization state generator and polarization state analyzer in environmental chamber2018 9,921,395'Beam focusing and beam collecting optics with wavelength dependent filter element adjustment of beam area'2018 9,882,897'Method and system for transmitting and receiving data, method and device for processing message'2018 9,790,245'Water soluble catalysts for NMR/MRI enhancement'2017 9,601,810'Method for manufacturing lithium ion cells'2017 9,500,843'Beam focusing and beam collecting optics'2016 9,442,016'Reflective focusing optics'2016 9,426,276'System and method for performing mobile telephone calling and/or messaging operations in-game during computer game application execution'2016 9,235,277'Profile management method'2016 9,209,444'Polymide blend nanofiber and its use in battery separator'2015 8,937,138'Initiating system for cationic polymerization and polymerization process'2015 8,886,995'Fault tolerant state machine for configuring software in a digital computer'2014 8,883,943'Isoolefin polymers and process for preparing the same'2014 8,700,832'Automated addition of file based hardware and file based access services in a data storage system'2014 8,587,781'View-finder in ellipsometer or the like systems'2013 8,570,513'Ellipsometric investigation and analysis of textured samples'2013 8,484,635'Unified installation for heterogeneous storage systems'2013 8,467,057'Ellipsometers and polarimeters comprising polarization state compensating beam directing sample wobble compensating system, and method of use'2013 8,462,341'Mounting for deviation angle self compensating substantially achromatic retarder'2013 8,436,994'Fast sample height, AOI and POI alignment in mapping ellipsometer or the like'2013 8,339,602'View-finder in ellipsometer or the like systems'2012 8,189,193'System and method of applying horizontally oriented arc-lamps in ellipsometer or the like systems'2012 8,159,672'Sample investigating system and method of use'2012 8,059,276'Ellipsometric investigation and analysis of textured samples'2011 8,013,996'Spatial filter in sample investigation system'2011 7,872,751'Fast sample height, AOI and POI alignment in mapping ellipsometer or the like'2011 7,760,820'Receiver having a signal reconstructing section for noise reduction, system and method thereof'2010 7,746,472'Automated ellipsometer and the like systems'2010 7,746,471'Flying mobile on-board ellipsometer, polarimeter, reflectometer and the like systems'2010 7,738,105'System and method of applying horizontally oriented arc-lamps in ellipsometer or the like systems'2010 7,717,679'Structure of balancing fan'2010 7,671,989'Information maintenance during intensity attenuation in focused beams'2010 7,633,625'Spectroscopic ellipsometer and polarimeter systems'2009 7,623,237'Sample investigating system'2009 7,623,238'System for and method of reducing change caused by motor vibrations in ellipsometers, polarimeters or the like'2009 7,616,319'Spectroscopic ellipsometer and polarimeter systems'2009 7,567,345'Ellipsometer meeting scheimpflug condition with provision of an essentially circular electromagnetic radiation spot on a sample'2009 7,554,662'Spatial filter means comprising an aperture with a non-unity aspect ratio in a system for investigating samples with electromagnetic radiation'2009 7,535,566'Beam chromatic shifting and directing means'2009 7,522,279'System for and method of investigating the exact same point on a sample substrate with multiple wavelengths'2009 7,508,510'System for and method of investigating the exact same point on a sample substrate with multiple wavelengths'2009 7,505,134'Automated ellipsometer and the like systems'2009 7,492,455'Discrete polarization state spectroscopic ellipsometer system and method of use'2009 7,489,400'System and method of applying xenon arc-lamps to provide 193 nm wavelengths'2009 7,468,794'Rotating compensator ellipsometer system with spatial filter equivalent'2008 7,336,361'Spectroscopic ellipsometer and polarimeter systems'2008 7,327,456'Spectrophotometer, ellipsometer, polarimeter and the like systems'2008 7,317,530'Combined spatial filter and relay systems'2008 7,317,529'Aspects of producing, directing, conditioning, impinging and detecting spectroscopic electromagnetic radiation from small spots on samples'2008 7,304,737'Rotating or rotatable compensator system providing aberation corrected electromagnetic raadiation to a spot on a sample at multiple angles of a incidence'2007 7,301,631'Control of uncertain angle of incidence of beam from Arc lamp'2007 7,277,171'Flying mobile on-board ellipsometer, polarimeter, reflectometer and the like systems'2007 7,274,450'Sample entry purge system in spectrophotometer, ellipsometer, polarimeter and the like systems'2007 7,265,838'Method of calibrating effects of multi-AOI-system for easy changing angles-of-incidence in ellipsometers and the like'2007 7,245,376'Combined spatial filter and relay systems in rotating compensator ellipsometer/polarimeter'2007 7,230,699'Sample orientation system and method'2007 7,215,424'Broadband ellipsometer or polarimeter system including at least one multiple element lens'2007 7,193,710'Rotating or rotatable compensator spectroscopic ellipsometer system including multiple element lenses'2007 7,158,231'Spectroscopic ellipsometer and polarimeter systems'2007 7,136,162'Alignment of ellipsometer beam to sample surface'2006 7,075,650'Discrete polarization state spectroscopic ellipsometer system and method of use'2006 7,057,717'System for and method of investigating the exact same point on a sample substrate with at least two wavelengths'2006 7,046,744'Method and apparatus for frequency offset estimation, and system utilizing same'2006 6,982,792'Spectrophotometer, ellipsometer, polarimeter and the like systems'2006 6,950,182'Functional equivalent to spatial filter in ellipsometer and the like systems'2005 6,930,813'Spatial filter source beam conditioning in ellipsometer and the like systems'2005 6,883,376'Method for determining the wall thickness and the speed of sound in a tube from reflected and transmitted ultrasound pulses'2005 6,859,278'Multi-AOI-system for easy changing angles-of-incidence in ellipsometer, polarimeter and reflectometer systems'2005 6,804,004'Multiple-element lens systems and methods for uncorrelated evaluation of parameters in parameterized mathematical model equations for lens retardance, in ellipometry and polarimetry'2004 6,634,233'Method for determining the wall thickness and the speed of sound in a tube from reflected and transmitted ultrasound pulses'2003 6,590,655'System and method of improving electromagnetic radiation beam characteristics in ellipsometer and the like systems'2003 6,549,282'Methods for uncorrelated evaluation of parameters in parameterized mathematical model equations for lens retardance, in ellipsometry and polarimetry systems'2003 6,456,376'Rotating compensator ellipsometer system with spatial filter'2002 6,430,631'Electronic circuit for the conversion of data'2002 6,323,424'Multiple electrical box mounting system having removable rings'2001 6,293,056'Multi-purpose above-ceiling utility support system'2001 6,188,022'Electrical box mounting system having removable rings'2001 6,098,939'Electrical junction box supporting bracket'2000 5,969,818'Beam folding optics system and method of use with application in ellipsometry and polarimetry'1999 5,963,327'Total internal reflection electromagnetic radiation beam entry to, and exit from, ellipsometer, polarimeter, reflectometer and the like systems'1999 5,805,285'Multiple order dispersive optics system and method of use'1998 5,666,201'Multiple order dispersive optics system and method of use'1997 4,658,827'Ultrasound scanner for tissue characterization'1987

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1997–2020Patents assigned to J A WOOLLAM CO INC (63)· patent assignee history

1997–2020Based in Lincoln, NE, US· patent location history

2000–2001Based in Agoura, CA, US· patent location history

2006–2020Based in Singapore, SG· patent location history

2010–2019Patents assigned to HE PING (20)· patent assignee history

2010–2019Patents assigned to LIPHARDT MARTIN M (10)· patent assignee history

2013–2014Patents assigned to EMC CORP (3)· patent assignee history

2013–2019Based in Cary, NC, US· patent location history

2016–2020Patents assigned to RAZER ASIA PACIFIC PTE LTD (5)· patent assignee history

2017–2020Based in Ningde, CN· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees

Assignee	Patents	Span
J A WOOLLAM CO INC	63	1997–2020
HE PINGself	20	2010–2019
LIPHARDT MARTIN M	10	2010–2019
RAZER ASIA PACIFIC PTE LTD	5	2016–2020
EMC CORP	3	2013–2014

Locations

Location	Patents	Span
Lincoln, NE, US	69	1997–2020
Singapore, SG	7	2006–2020
Cary, NC, US	4	2013–2019
Agoura, California, US	4	2000–2001
Ningde, CN	3	2017–2020