Inventor

Chul-Soon Kwon

Inventor
Seoul, KR

Overview

18→
Patents
1999–2011
Patent span
Electricity
Primary field (CPC H)

Patents· 18 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

H10Bprimary
H10BElectronic memory devices38%
H10DInorganic electric semiconductor devices29%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h109%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h109%
G11CStatic stores6%
G06KGraphical data reading3%
G06QInformation and communication technology [ict] specially adapted for administrative, commercial, financial, managerial or supervisory purposes3%
G07FCoin-freed or like apparatus3%
PatentTitleYear
7,956,343'Nonvolatile memory devices and method of manufacturing the same'20117,564,092'Flash memory device having a split gate'20097,560,765'Nonvolatile memory device and method of fabricating the same'20097,553,726'Method of fabricating nonvolatile memory device'20097,375,391'Semiconductor device with split gate electrode structure and method for manufacturing the semiconductor device'20087,205,194'Method of fabricating a flash memory cell'20077,195,933'Semiconductor device having a measuring pattern and a method of measuring the semiconductor device using the measuring pattern'20077,115,470'Methods of fabricating flash memory cell having split-gate structure using spacer oxidation process'20067,094,646'Flash memory device having a split gate and method of manufacturing the same'20067,081,380'Method of forming a conductive pattern of a semiconductor device and method of manufacturing a non-volatile semiconductor memory device using the same'20066,977,200'Method of manufacturing split-gate memory'20056,974,748'Semiconductor device with split gate electrode structure and method for manufacturing the semiconductor device'20056,924,505'Semiconductor device having a measuring pattern and a method of measuring the semiconductor device using the measuring pattern'20056,853,028'Non-volatile memory device having dummy pattern'20056,800,525'Method of manufacturing split gate flash memory device'20046,705,518'System and method for providing tourism service using RF IC card, and storage medium for storing tourism service algorithm thereof'20046,140,174'Methods of forming wiring layers on integrated circuits including regions of high and low topography'20005,899,740'Methods of fabricating copper interconnects for integrated circuits'1999

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1999–2011Patents assigned to SAMSUNG ELECTRONICS CO LTD (16)· patent assignee history
1999–2011Based in Seoul, KR· patent location history
2004Patents assigned to KOOKMIN CREDIT CARD CO LTD (1)· patent assignee history
2006Patents assigned to SAMSUNG ELECTRONICS LTD CO (1)· patent assignee history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
SAMSUNG ELECTRONICS CO LTD161999–2011
KOOKMIN CREDIT CARD CO LTD12004
SAMSUNG ELECTRONICS LTD CO12006
Locations
LocationPatentsSpan
Seoul, KR181999–2011